Improved diffusion profiles in back-contacted back-junction Si solar cells with an overcompensated boron-doped emitter

2011 ◽  
Vol 208 (12) ◽  
pp. 2871-2883 ◽  
Author(s):  
Christian Reichel ◽  
Martin Bivour ◽  
Filip Granek ◽  
Martin Hermle ◽  
Stefan W. Glunz
2002 ◽  
Vol 91 (8) ◽  
pp. 4853-4856 ◽  
Author(s):  
Tuong Khanh Vu ◽  
Yoshio Ohshita ◽  
Kenji Araki ◽  
Masafumi Yamaguchi

2017 ◽  
Vol 475 ◽  
pp. 186-191 ◽  
Author(s):  
Tianguo Deng ◽  
Kazuhiro Gotoh ◽  
Ryota Takabe ◽  
Zhihao Xu ◽  
Suguru Yachi ◽  
...  

2014 ◽  
Vol 24 (6) ◽  
pp. 305-309
Author(s):  
Soo Min Kim ◽  
Soohyun Bae ◽  
Young Do Kim ◽  
Sungeun Park ◽  
Yoonmook Kang ◽  
...  

Author(s):  
Mukesh Pratap Singh ◽  
Mohd Amir

Abstract We have investigated the effect of emitter design key parameters such as depth factor and the peak concentration for different types of emitter diffusion profiles (uniform, exponential, Gaussian, and Erfc) on the performance of silicon (Si) solar cells. The value of the depth factor is optimized as 0.1 µm for all these emitter diffusion profiles. Afterward, the peak concentration value is optimized for all the diffusion profiles. A close examination of relative diffusion lengths, conductivities, recombination rates, internal and external quantum efficiencies for these diffusion profiles revealed that among all the considered emitter diffusion profiles, the Erfc profile exhibits the maximum efficiency of 23.53% with an optimized peak concentration of 2×1020 cm-3 for emitter and 1×1019 cm-3 for the back surface filed doping. PC1D was used for all the simulations.


2018 ◽  
Vol 216 (10) ◽  
pp. 1800603 ◽  
Author(s):  
Audrey Morisset ◽  
Raphaël Cabal ◽  
Bernadette Grange ◽  
Clément Marchat ◽  
José Alvarez ◽  
...  

2020 ◽  
Vol 12 (11) ◽  
pp. 12972-12981 ◽  
Author(s):  
Kurias K. Markose ◽  
Manu Shaji ◽  
Swasti Bhatia ◽  
Pradeep R. Nair ◽  
Kachirayil J. Saji ◽  
...  

1981 ◽  
Vol 42 (C4) ◽  
pp. C4-1155-C4-1164 ◽  
Author(s):  
Y. Kuwano ◽  
M. Ohnishi
Keyword(s):  

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