Charge trapping and interface trap generation in thin nitrided silicon dioxide films for VLSI

1990 ◽  
Vol 1 (2) ◽  
pp. 149-153
Author(s):  
Maurizio Severi ◽  
Maurizio Irnpronta ◽  
Paolo Negrini ◽  
Stefano Vassura
Keyword(s):  
Silicon Dioxide ◽  
Charge Trapping ◽  
Interface Trap ◽  
Silicon Dioxide Films

Light emission and charge trapping in Er-doped silicon dioxide films containing silicon nanocrystals

2005 ◽  
Vol 86 (15) ◽  
pp. 151914 ◽  
Author(s):  
A. Nazarov ◽  
J. M. Sun ◽  
W. Skorupa ◽  
R. A. Yankov ◽  
I. N. Osiyuk ◽  
...  
Keyword(s):  
Silicon Dioxide ◽  
Silicon Nanocrystals ◽  
Light Emission ◽  
Charge Trapping ◽  
Silicon Dioxide Films ◽  
Doped Silicon ◽  
Er Doped

Effect of oxynitridation on charge trapping properties of ultrathin silicon dioxide films

1997 ◽  
Vol 81 (4) ◽  
pp. 1825-1828 ◽  
Author(s):  
Hisashi Fukuda ◽  
Shoji Murai ◽  
Toshiaki Endoh ◽  
Shigeru Nomura
Keyword(s):  
Silicon Dioxide ◽  
Charge Trapping ◽  
Silicon Dioxide Films

Enhanced conduction and minimized charge trapping in electrically alterable read‐only memories using off‐stoichiometric silicon dioxide films

1984 ◽  
Vol 55 (8) ◽  
pp. 3000-3019 ◽  
Author(s):  
D. J. DiMaria ◽  
D. W. Dong ◽  
F. L. Pesavento ◽  
C. Lam ◽  
S. D. Brorson
Keyword(s):  
Silicon Dioxide ◽  
Charge Trapping ◽  
Silicon Dioxide Films

Charge trapping in ion-sputtered silicon dioxide films on silicon

1990 ◽  
Vol 19 (3) ◽  
pp. 231-234
Author(s):  
R. B. Sethi ◽  
D. R. Young ◽  
J. David Zook
Keyword(s):  
Silicon Dioxide ◽  
Charge Trapping ◽  
Silicon Dioxide Films

Measurements and Modelling of Thin Silicon Dioxide Films on Silicon

1989 ◽  
Author(s):  
A. Kalnitsky ◽  
S. P. Tay ◽  
J. P. Ellul ◽  
J. W. Andrews ◽  
E. A. Irene ◽  
...  
Keyword(s):  
Silicon Dioxide ◽  
Silicon Dioxide Films ◽  
Thin Silicon

Selection and characteristics of peptides that bind thermally grown silicon dioxide films

2005 ◽  
Vol 22 (5-6) ◽  
pp. 201-204 ◽  
Author(s):  
Edward Eteshola ◽  
Leonard J. Brillson ◽  
Stephen Craig Lee
Keyword(s):  
Silicon Dioxide ◽  
Silicon Dioxide Films ◽  
Thermally Grown

Characterization of Tunneling Current through Ultrathin Silicon Dioxide Films by Different-Metal Gates Method

2008 ◽  
Vol 47 (11) ◽  
pp. 8317-8320
Author(s):  
Takaaki Hirokane ◽  
Naoto Yoshii ◽  
Tatsuya Okazaki ◽  
Shinichi Urabe ◽  
Kazuo Nishimura ◽  
...  
Keyword(s):  
Silicon Dioxide ◽  
Tunneling Current ◽  
Metal Gates ◽  
Silicon Dioxide Films

scholarly journals Modeling the breakdown spots in silicon dioxide films as point contacts

1999 ◽  
Vol 75 (7) ◽  
pp. 959-961 ◽  
Author(s):  
J. Suñé ◽  
E. Miranda ◽  
M. Nafría ◽  
X. Aymerich
Keyword(s):  
Silicon Dioxide ◽  
Point Contacts ◽  
Silicon Dioxide Films
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