Spectroscopic Diagnostics of Pulsed Microwave Plasmas used for Nanocrystalline Diamond Growth

2008 ◽  
Vol 14 (7-8) ◽  
pp. 173-180 ◽  
Author(s):  
Fabien Bénédic ◽  
Xavier Duten ◽  
Ousmane Syll ◽  
Guillaume Lombardi ◽  
Khaled Hassouni ◽  
...  
2010 ◽  
Vol 114 (9) ◽  
pp. 3822-3824 ◽  
Author(s):  
K. Tsugawa ◽  
M. Ishihara ◽  
J. Kim ◽  
Y. Koga ◽  
M. Hasegawa

2011 ◽  
Vol 20 (5-6) ◽  
pp. 833-838 ◽  
Author(s):  
K. Tsugawa ◽  
S. Kawaki ◽  
M. Ishihara ◽  
J. Kim ◽  
Y. Koga ◽  
...  

2007 ◽  
Vol 101 (10) ◽  
pp. 103501 ◽  
Author(s):  
N. Mizuochi ◽  
J. Isoya ◽  
J. Niitsuma ◽  
T. Sekiguchi ◽  
H. Watanabe ◽  
...  

1997 ◽  
Vol 502 ◽  
Author(s):  
A. N. Goyette ◽  
J. E. Lawler ◽  
L. W. Anderson ◽  
D. M. Gruen ◽  
T. G. Mccauley ◽  
...  

ABSTRACTWe have measured the steady state concentration of gas phase C2 in Ar/H2/CH4 and Ar/H2/C60 microwave plasmas used for the deposition of nanocrystalline diamond films. High sensitivity white light absorption spectroscopy is used to monitor the C2 density using the d 3 Π ← a3Π (0,0) vibrational band of C2 as chamber pressure, microwave power, substrate temperature and feed gas mixtures are varied in both chemistries. Understanding how these parameters influence the C2 density in the plasma volume provides insight into discharge mechanisms relevant to the deposition of nanocrystalline diamond.


2004 ◽  
Vol 96 (11) ◽  
pp. 6739-6751 ◽  
Author(s):  
G. Lombardi ◽  
K. Hassouni ◽  
F. Bénédic ◽  
F. Mohasseb ◽  
J. Röpcke ◽  
...  

1997 ◽  
Vol 82 (9) ◽  
pp. 4546-4550 ◽  
Author(s):  
D. Zhou ◽  
A. R. Krauss ◽  
L. C. Qin ◽  
T. G. McCauley ◽  
D. M. Gruen ◽  
...  

2004 ◽  
Vol 96 (11) ◽  
pp. 6724-6732 ◽  
Author(s):  
J. R. Rabeau ◽  
P. John ◽  
J. I.B. Wilson ◽  
Y. Fan

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