Nanoscale Structural and Electronic Properties of Ultrathin Blends of Two Polyaromatic Molecules: A Kelvin Probe Force Microscopy Investigation

ChemPhysChem ◽  
2006 ◽  
Vol 7 (4) ◽  
pp. 847-853 ◽  
Author(s):  
Vincenzo Palermo ◽  
Susanna Morelli ◽  
Matteo Palma ◽  
Christopher Simpson ◽  
Fabian Nolde ◽  
...  
Keyword(s):  
Electronic Properties ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Microscopy Investigation ◽  
Structural And Electronic Properties

The local electronic properties of individual Pt atoms adsorbed on TiO2(110) studied by Kelvin probe force microscopy and first-principles simulations

Nanoscale ◽  
2017 ◽  
Vol 9 (18) ◽  
pp. 5812-5821 ◽  
Author(s):  
Ayhan Yurtsever ◽  
Delia Fernández-Torre ◽  
Jo Onoda ◽  
Masayuki Abe ◽  
Seizo Morita ◽  
...  
Keyword(s):  
Electronic Properties ◽  
First Principles ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy

Suppression of the morphology mismatch at graphene/n-type organic semiconductor interfaces: a scanning Kelvin probe force microscopy investigation

2020 ◽  
Vol 8 (24) ◽  
pp. 8145-8154 ◽  
Author(s):  
Federico Chianese ◽  
Fabio Chiarella ◽  
Mario Barra ◽  
Andrea Candini ◽  
Marco Affronte ◽  
...  
Keyword(s):  
Organic Semiconductor ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Graphene Electrode ◽  
Semiconductor Interfaces ◽  
Scanning Kelvin Probe ◽  
Microscopy Investigation ◽  
Contact Effects

Contact effects occurring at organic-semiconductor/graphene-electrode interfaces are directly analyzed in unprecedented detail in n-type OFETs via scanning Kelvin probe force microscopy.

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