Microstructure and Elastic Constants of Transition Metal Dichalcogenide Monolayers from Friction and Shear Force Microscopy

Xiaomin Xu; Thorsten Schultz; Ziyu Qin; Nikolai Severin; Benedikt Haas; Sumin Shen; Jan N. Kirchhof; Andreas Opitz; Christoph T. Koch; Kirill Bolotin; Jürgen P. Rabe; Goki Eda; Norbert Koch

doi:10.1002/adma.201803748

Microstructure and Elastic Constants of Transition Metal Dichalcogenide Monolayers from Friction and Shear Force Microscopy

Advanced Materials ◽

10.1002/adma.201803748 ◽

2018 ◽

Vol 30 (39) ◽

pp. 1803748 ◽

Cited By ~ 5

Author(s):

Xiaomin Xu ◽

Thorsten Schultz ◽

Ziyu Qin ◽

Nikolai Severin ◽

Benedikt Haas ◽

...

Keyword(s):

Transition Metal ◽

Elastic Constants ◽

Shear Force ◽

Transition Metal Dichalcogenide ◽

Force Microscopy ◽

Shear Force Microscopy

Download Full-text

Energy-Level Alignment at Interfaces between Transition-Metal Dichalcogenide Monolayers and Metal Electrodes Studied with Kelvin Probe Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c01612 ◽

2021 ◽

Author(s):

Pavel A. Markeev ◽

Emad Najafidehaghani ◽

Ziyang Gan ◽

Kai Sotthewes ◽

Antony George ◽

...

Keyword(s):

Transition Metal ◽

Energy Level ◽

Kelvin Probe Force Microscopy ◽

Transition Metal Dichalcogenide ◽

Kelvin Probe ◽

Metal Electrodes ◽

Force Microscopy ◽

Energy Level Alignment

Download Full-text

Radiofrequency impedance variation of characterized tip–sample nanocontacts in shear force microscopy with vertically oriented cantilevers connected to a vector network analyser

Measurement Science and Technology ◽

10.1088/0957-0233/24/9/095901 ◽

2013 ◽

Vol 24 (9) ◽

pp. 095901

Author(s):

G Valdrè ◽

D Moro

Keyword(s):

Shear Force ◽

Force Microscopy ◽

Impedance Variation ◽

Network Analyser ◽

Shear Force Microscopy

Download Full-text

Towards High-Resolution Tissue Imaging Using Nanospray Desorption Electrospray Ionization Mass Spectrometry Coupled to Shear Force Microscopy

Journal of the American Society for Mass Spectrometry ◽

10.1007/s13361-017-1750-8 ◽

2017 ◽

Vol 29 (2) ◽

pp. 316-322 ◽

Cited By ~ 24

Author(s):

Son N. Nguyen ◽

Ryan L. Sontag ◽

James P. Carson ◽

Richard A. Corley ◽

Charles Ansong ◽

...

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Electrospray Ionization ◽

Electrospray Ionization Mass Spectrometry ◽

Shear Force ◽

Desorption Electrospray Ionization ◽

Tissue Imaging ◽

Ionization Mass ◽

Force Microscopy ◽

Shear Force Microscopy

Download Full-text

A novel ultrasonic resonance sample-tip distance regulation for near field optical microscopy and shear force microscopy

Solid State Communications ◽

10.1016/0038-1098(95)00787-3 ◽

1996 ◽

Vol 98 (7) ◽

pp. 661-664 ◽

Cited By ~ 10

Author(s):

X Zhu ◽

G.S Huang ◽

H.T Zhou ◽

Y.D Dai

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Force Microscopy ◽

Ultrasonic Resonance ◽

Shear Force Microscopy ◽

Distance Regulation

Download Full-text

Imaging sub-surface defects in power electronic modules using shear-force microscopy

2020 IEEE 70th Electronic Components and Technology Conference (ECTC) ◽

10.1109/ectc32862.2020.00221 ◽

2020 ◽

Author(s):

Vijay Venkatesh ◽

Shailesh N. Joshi ◽

Vishnu Baba Sundaresan

Keyword(s):

Shear Force ◽

Surface Defects ◽

Power Electronic ◽

Force Microscopy ◽

Shear Force Microscopy

Download Full-text

Direct manipulation of metallic nanosheets by shear force microscopy

Journal of Microscopy ◽

10.1111/jmi.12710 ◽

2018 ◽

Vol 271 (2) ◽

pp. 222-229 ◽

Cited By ~ 1

Author(s):

Z. BI ◽

W. CAI ◽

Y. WANG ◽

G. SHANG

Keyword(s):

Shear Force ◽

Direct Manipulation ◽

Force Microscopy ◽

Shear Force Microscopy

Download Full-text

(Invited) Electrical Atomic Force Microscopy for 2D Transition Metal Dichalcogenide Materials

ECS Meeting Abstracts ◽

10.1149/ma2017-01/16/997 ◽

2017 ◽

Keyword(s):

Atomic Force Microscopy ◽

Transition Metal ◽

Transition Metal Dichalcogenide ◽

Force Microscopy ◽

Atomic Force

Download Full-text

Shear force microscopy with capacitance detection for near‐field scanning optical microscopy

Applied Physics Letters ◽

10.1063/1.113269 ◽

1995 ◽

Vol 66 (11) ◽

pp. 1432-1434 ◽

Cited By ~ 23

Author(s):

J‐K. Leong ◽

C. C. Williams

Keyword(s):

Optical Microscopy ◽

Shear Force ◽

Near Field ◽

Force Microscopy ◽

Capacitance Detection ◽

Scanning Optical Microscopy ◽

Shear Force Microscopy ◽

Near Field Scanning

Download Full-text

Interfacial shear force microscopy

Physical Review B ◽

10.1103/physrevb.62.13174 ◽

2000 ◽

Vol 62 (19) ◽

pp. 13174-13181 ◽

Cited By ~ 85

Author(s):

Khaled Karrai ◽

Ingo Tiemann

Keyword(s):

Shear Force ◽

Interfacial Shear ◽

Force Microscopy ◽

Shear Force Microscopy

Download Full-text

Shear force microscopy using piezoresistive cantilevers in surface metrology

10.1117/12.2066247 ◽

2014 ◽

Cited By ~ 2

Author(s):

Teodor Gotszalk ◽

Daniel Kopiec ◽

Andrzej Sierakowski ◽

Paweł Janus ◽

Piotr Grabiec ◽

...

Keyword(s):

Shear Force ◽

Surface Metrology ◽

Force Microscopy ◽

Piezoresistive Cantilevers ◽

Shear Force Microscopy

Download Full-text