Shear force microscopy using piezoresistive cantilevers in surface metrology

Author(s):  
Teodor Gotszalk ◽  
Daniel Kopiec ◽  
Andrzej Sierakowski ◽  
Paweł Janus ◽  
Piotr Grabiec ◽  
...  
2009 ◽  
Vol 86 (4-6) ◽  
pp. 1212-1215 ◽  
Author(s):  
M. Woszczyna ◽  
T. Gotszalk ◽  
P. Zawierucha ◽  
M. Zielony ◽  
Tzv. Ivanow ◽  
...  

2018 ◽  
Vol 271 (2) ◽  
pp. 222-229 ◽  
Author(s):  
Z. BI ◽  
W. CAI ◽  
Y. WANG ◽  
G. SHANG

2000 ◽  
Vol 62 (19) ◽  
pp. 13174-13181 ◽  
Author(s):  
Khaled Karrai ◽  
Ingo Tiemann

2006 ◽  
Vol 18 (4) ◽  
pp. 044009 ◽  
Author(s):  
Tomoko Gray ◽  
Jason Killgore ◽  
Jingdong Luo ◽  
Alex K Y Jen ◽  
René M Overney

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