An Efficient Test Methodology for Image Processing Applications Based on Error-Tolerance

2013 ◽  
Author(s):  
Tong-Yu Hsieh ◽  
Yi-Han Peng ◽  
Chia-Chi Ku
Keyword(s):  
Image Processing ◽  
Error Tolerance ◽  
Test Methodology ◽  
Efficient Test

Power–Delay-Error-Efficient Approximate Adder for Error-Resilient Applications

2019 ◽  
Vol 28 (10) ◽  
pp. 1950171 ◽  
Author(s):  
Vinay Kumar ◽  
Ankit Singh ◽  
Shubham Upadhyay ◽  
Binod Kumar
Keyword(s):  
Image Processing ◽  
Power Consumption ◽  
Logic Gate ◽  
Logic Gates ◽  
Error Tolerance ◽  
Approximate Computing ◽  
Processing Application ◽  
Error Resilient ◽  
Delay Performance ◽  
Prime Concern

Power dissipation has been the prime concern for CMOS circuits. Approximate computing is a potential solution for addressing this concern as it reduces power consumption resulting in improved performance in terms of power–delay product (PDP). Decrease of power consumption in approximate computing is achieved by approximating the demand of accuracy as per the error tolerance of the system. This paper presents a new approach for designing approximate adder by introducing inexactness in the existing logic gate(s). Approximated logic gates provide flexibility in designing low power error-resilient systems depending on the error tolerance of the applications such as image processing and data mining. The proposed approximate adder (PAA) has higher accuracy than existing approximate adders with normalized mean error distance of 0.123 and 0.1256 for 16-bit and 32-bit adder, respectively, and lower PDP of 1.924E[Formula: see text]18[Formula: see text]J for 16-bit adder and 5.808E[Formula: see text]18[Formula: see text]J for 32-bit adder. The PAA also performs better than some of the recent approximate adders reported in literature in terms of layout area and delay. Performance of PAA has also been evaluated with an image processing application.

An Error Rate Based Test Methodology to Support Error-Tolerance

2008 ◽  
Vol 57 (1) ◽  
pp. 204-214 ◽  
Author(s):  
Tong-Yu Hsieh ◽  
Kuen-Jong Lee ◽  
M.A. Breuer
Keyword(s):  
Error Rate ◽  
Error Tolerance ◽  
Test Methodology

Some comments about observations and image processing of comet 29P/Schwassmann-Wachmann 1

1999 ◽  
Vol 173 ◽  
pp. 243-248
Author(s):  
D. Kubáček ◽  
A. Galád ◽  
A. Pravda
Keyword(s):  
Image Processing ◽  
Large Scale ◽  
Harvard College ◽  
Oak Ridge ◽  
Large Scale Structures ◽  
Short Period Comet ◽  
Short Period ◽  
Scale Structures ◽  
Harvard College Observatory ◽  
Period Comet

AbstractUnusual short-period comet 29P/Schwassmann-Wachmann 1 inspired many observers to explain its unpredictable outbursts. In this paper large scale structures and features from the inner part of the coma in time periods around outbursts are studied. CCD images were taken at Whipple Observatory, Mt. Hopkins, in 1989 and at Astronomical Observatory, Modra, from 1995 to 1998. Photographic plates of the comet were taken at Harvard College Observatory, Oak Ridge, from 1974 to 1982. The latter were digitized at first to apply the same techniques of image processing for optimizing the visibility of features in the coma during outbursts. Outbursts and coma structures show various shapes.

Analysis of the 9th November 1990 flare

2000 ◽  
Vol 179 ◽  
pp. 229-232
Author(s):  
Anita Joshi ◽  
Wahab Uddin
Keyword(s):  
Image Processing ◽  
Two Dimensional ◽  
Temporal Behaviour ◽  
Contour Maps ◽  
Dimensional Measurements ◽  
Processing Software ◽  
Image Processing Software

AbstractIn this paper we present complete two-dimensional measurements of the observed brightness of the 9th November 1990Hαflare, using a PDS microdensitometer scanner and image processing software MIDAS. The resulting isophotal contour maps, were used to describe morphological-cum-temporal behaviour of the flare and also the kernels of the flare. Correlation of theHαflare with SXR and MW radiations were also studied.

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