2020 IEEE Latin-American Test Symposium (LATS)
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9781728187310
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Resistance of the Montgomery kP Algorithm against Simple SCA: Theory and Practice

2020 ◽  
Author(s):  
Ievgen Kabin ◽  
Zoya Dyka ◽  
Marcin Aftowicz ◽  
Dan Klann ◽  
Peter Langendoerfer
Keyword(s):  
Theory And Practice

scholarly journals Evaluating Software-based Hardening Techniques for General-Purpose Registers on a GPGPU

2020 ◽  
Author(s):  
Marcio M. Goncalves ◽  
Jose Rodrigo Azambuja ◽  
Josie E. R. Condia ◽  
Matteo Sonza Reorda ◽  
Luca Sterpone
Keyword(s):  
General Purpose

scholarly journals Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

2020 ◽  
Author(s):  
Thiago Copetti ◽  
Guilherme Cardoso Medeiros ◽  
Mottaqiallah Taouil ◽  
Said Hamdioui ◽  
Leticia Bolzani Poehls ◽  
...  
Keyword(s):  
The Impact ◽  
Resistive Defects
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