Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures
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A test structure of a MOSFET with Si-implanted gate-SiO/sub 2/ for EEPROM applications

Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1994.303488 ◽

2002 ◽

Author(s):

T. Ohzone ◽

T. Hori

Keyword(s):

Test Structure

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Modeling of test structures for efficient online defect monitoring using a digital tester

Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1994.303493 ◽

2002 ◽

Cited By ~ 14

Author(s):

C. Hess ◽

L.H. Weiland

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Design of matching test structures [IC components]

Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1994.303509 ◽

2002 ◽

Cited By ~ 17

Author(s):

H.P. Tuinhout

Keyword(s):

Matching Test

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Current and temperature distribution impact on electromigration failure location in SWEAT structure

Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1994.303473 ◽

2002 ◽

Cited By ~ 3

Author(s):

F. Giroux ◽

C. Gounelle ◽

N. Vialle ◽

P. Mortini ◽

G. Ghibaudo

Keyword(s):

Temperature Distribution ◽

Failure Location

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Test structures for extraction of MOSFET capacitances

Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1994.303511 ◽

2002 ◽

Cited By ~ 1

Author(s):

H. Gaffur ◽

Sukyoon Yoon

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Fast and accurate on-wafer extraction of parasitic resistances in GaAs MESFET's

Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1994.303512 ◽

2002 ◽

Cited By ~ 3

Author(s):

P. Debie ◽

L. Martens ◽

D. De Zutter

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SRAM-based extraction of defect characteristics

Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1994.303494 ◽

2002 ◽

Cited By ~ 9

Author(s):

J. Khare ◽

W. Maly ◽

S. Griep ◽

D. Schmitt-Landsiedel

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An automated wafermap fast test for bipolar induced breakdown in NMOS transistors

Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1994.303508 ◽

2002 ◽

Cited By ~ 2

Author(s):

G.J. Gaston ◽

B.S. Bold ◽

J.B. Mason

Keyword(s):

Nmos Transistors

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Accurate characterization of MOSFET overlap/fringing capacitance for circuit design

Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1994.303510 ◽

2002 ◽

Cited By ~ 4

Author(s):

C.C. McAndrew ◽

G. Zaneski ◽

P.A. Layman ◽

S.G. Ayyar

Keyword(s):

Circuit Design ◽

Fringing Capacitance

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Automatic in-line to end-of-line defect correlation using FSRAM test structure for quick killer defect identification

Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1994.303484 ◽

2002 ◽

Cited By ~ 5

Author(s):

D. Wilson ◽

A.J. Walton

Keyword(s):

Test Structure ◽

Line Defect ◽

Defect Identification

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Proceedings of 1994 IEEE International Conference on Microelectronic Test StructuresLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A test structure of a MOSFET with Si-implanted gate-SiO/sub 2/ for EEPROM applications

Modeling of test structures for efficient online defect monitoring using a digital tester

Design of matching test structures [IC components]

Current and temperature distribution impact on electromigration failure location in SWEAT structure

Test structures for extraction of MOSFET capacitances

Fast and accurate on-wafer extraction of parasitic resistances in GaAs MESFET's

SRAM-based extraction of defect characteristics

An automated wafermap fast test for bipolar induced breakdown in NMOS transistors

Accurate characterization of MOSFET overlap/fringing capacitance for circuit design

Automatic in-line to end-of-line defect correlation using FSRAM test structure for quick killer defect identification

Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures
Latest Publications