ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures
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A study of clustering using microelectronic defect monitors

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1992.185934 ◽

2003 ◽

Cited By ~ 1

Author(s):

A.V.S. Satya

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Test structure and experimental analysis of bipolar hot-carrier degradation including stress field effect

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1992.185949 ◽

2003 ◽

Author(s):

H. Shimamoto ◽

M. Tanabe ◽

T. Onai ◽

K. Washio ◽

T. Nakamura

Keyword(s):

Stress Field ◽

Experimental Analysis ◽

Field Effect ◽

Test Structure ◽

Hot Carrier ◽

Hot Carrier Degradation

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A modular 0.7 mu m CMOS JESSI test chip for multi purpose applications

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1992.185960 ◽

2003 ◽

Cited By ~ 3

Author(s):

T. Brenner ◽

N. Maene ◽

S. Lindenkreuz ◽

J. le Ber ◽

H. Richter ◽

...

Keyword(s):

Test Chip

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Suppression of measurement errors in effective-MOSFET-channel-length extraction

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1992.185971 ◽

2003 ◽

Cited By ~ 4

Author(s):

K. Terada

Keyword(s):

Measurement Errors ◽

Channel Length

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Voltage-dividing potentiometer enhancements for high-precision feature placement metrology

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1992.185964 ◽

2003 ◽

Cited By ~ 9

Author(s):

R.A. Allen ◽

M.W. Cresswell ◽

C.H. Ellenwood ◽

L.W. Linholm

Keyword(s):

High Precision

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Life time evaluation of MOSFET in ULSIs using photon emission method

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1992.185946 ◽

2003 ◽

Author(s):

N. Tsutsu ◽

Y. Uraoka ◽

T. Morii ◽

K. Tsuji

Keyword(s):

Photon Emission ◽

Life Time ◽

Emission Method ◽

Time Evaluation

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A new and simple test structure for evaluating the sectional photo-sensitivity distribution of pixels in a frame-transfer CCD image sensor

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1992.185955 ◽

2003 ◽

Author(s):

M. Okigawa

Keyword(s):

Image Sensor ◽

Test Structure ◽

Simple Test ◽

Sensitivity Distribution ◽

Ccd Image Sensor ◽

Ccd Image

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Effective channel length determination using punchthrough voltage

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1992.185941 ◽

2003 ◽

Cited By ~ 1

Author(s):

S. Nakanishi ◽

M. Hoijer ◽

Y. Saitoh ◽

Y. Katoh ◽

Y. Kojima ◽

...

Keyword(s):

Channel Length ◽

Length Determination ◽

Effective Channel

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A new latch-up test structure for practical design methodology for internal circuits in the standard cell-based CMOS/BiCMOS LSIs

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1992.185927 ◽

2003 ◽

Cited By ~ 1

Author(s):

T. Aoki

Keyword(s):

Design Methodology ◽

Test Structure ◽

Standard Cell ◽

Practical Design ◽

Latch Up

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Accurate determination of CMOS capacitance parameters using multilayer structures

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures ◽

10.1109/icmts.1992.185938 ◽

2003 ◽

Cited By ~ 1

Author(s):

W. de Lange

Keyword(s):

Accurate Determination ◽

Multilayer Structures

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ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test StructuresLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A study of clustering using microelectronic defect monitors

Test structure and experimental analysis of bipolar hot-carrier degradation including stress field effect

A modular 0.7 mu m CMOS JESSI test chip for multi purpose applications

Suppression of measurement errors in effective-MOSFET-channel-length extraction

Voltage-dividing potentiometer enhancements for high-precision feature placement metrology

Life time evaluation of MOSFET in ULSIs using photon emission method

A new and simple test structure for evaluating the sectional photo-sensitivity distribution of pixels in a frame-transfer CCD image sensor

Effective channel length determination using punchthrough voltage

A new latch-up test structure for practical design methodology for internal circuits in the standard cell-based CMOS/BiCMOS LSIs

Accurate determination of CMOS capacitance parameters using multilayer structures

ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures
Latest Publications