European Test Workshop 1999 (Cat. No.PR00390)
Latest Publications

TOTAL DOCUMENTS

27

(FIVE YEARS 0)

H-INDEX

7

(FIVE YEARS 0)

Published By IEEE Comput. Soc

076950390x

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Extending fault-based testing to microelectromechanical systems

European Test Workshop 1999 (Cat. No.PR00390) ◽

10.1109/etw.1999.804234 ◽

2003 ◽

Cited By ~ 2

Author(s):

S. Mir ◽

B. Charlot ◽

B. Courtois

Keyword(s):

Microelectromechanical Systems

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Test configuration minimization for the logic cells of SRAM-based FPGAs: a case study

European Test Workshop 1999 (Cat. No.PR00390) ◽

10.1109/etw.1999.804520 ◽

2003 ◽

Cited By ~ 4

Author(s):

M. Renovell ◽

J.M. Portal ◽

J. Figueras ◽

Y. Zorian

Keyword(s):

Test Configuration ◽

Logic Cells

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Application of supply current testing to analogue circuits, towards a structural analogue test methodology

European Test Workshop 1999 (Cat. No.PR00390) ◽

10.1109/etw.1999.804221 ◽

2003 ◽

Cited By ~ 7

Author(s):

H. Manhaeve ◽

J. Verfaillie ◽

B. Straka ◽

J.P. Cornil

Keyword(s):

Structural Analogue ◽

Current Testing ◽

Test Methodology ◽

Analogue Circuits ◽

Supply Current

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Functional and structural testing of switched-current circuits

European Test Workshop 1999 (Cat. No.PR00390) ◽

10.1109/etw.1999.803821 ◽

2003 ◽

Cited By ~ 5

Author(s):

M. Renovell ◽

F. Azais ◽

J.-C. Bodin ◽

Y. Bertrand

Keyword(s):

Structural Testing ◽

Switched Current

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A new approach for the nonlinearity test of ADCs/DACs and its application for BIST

European Test Workshop 1999 (Cat. No.PR00390) ◽

10.1109/etw.1999.804206 ◽

2003 ◽

Author(s):

Fang Xu

Keyword(s):

New Approach ◽

Nonlinearity Test

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Design of an automatic testing for FPGAs

European Test Workshop 1999 (Cat. No.PR00390) ◽

10.1109/etw.1999.804522 ◽

2003 ◽

Cited By ~ 9

Author(s):

A. Doumar ◽

T. Ohmameuda ◽

H. Ito

Keyword(s):

Automatic Testing

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On maximizing the coverage of catastrophic and parametric faults

European Test Workshop 1999 (Cat. No.PR00390) ◽

10.1109/etw.1999.804430 ◽

2003 ◽

Cited By ~ 3

Author(s):

A.M. Brosa ◽

J. Figueras

Keyword(s):

Parametric Faults

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The role of test protocols in testing embedded-core-based system ICs

European Test Workshop 1999 (Cat. No.PR00390) ◽

10.1109/etw.1999.804248 ◽

2003 ◽

Cited By ~ 18

Author(s):

E.J. Marinissen ◽

M. Lousberg

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On random pattern testability of cryptographic VLSI cores

European Test Workshop 1999 (Cat. No.PR00390) ◽

10.1109/etw.1999.803820 ◽

2003 ◽

Cited By ~ 4

Author(s):

A. Schubert ◽

W. Anheier

Keyword(s):

Random Pattern

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Cost effective testing of systems on silicon: areas for optimization

European Test Workshop 1999 (Cat. No.PR00390) ◽

10.1109/etw.1999.804519 ◽

2003 ◽

Cited By ~ 1

Author(s):

P. Muhmenthaler

Keyword(s):

Cost Effective

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