IEEE Radiation Effects Data Workshop
Latest Publications

TOTAL DOCUMENTS

32

(FIVE YEARS 0)

H-INDEX

10

(FIVE YEARS 0)

Published By IEEE

0780375440

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

SEE and TID of emerging non-volatile memories

IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2002.1045534 ◽

2003 ◽

Cited By ~ 13

Author(s):

D.N. Nguyen ◽

L.Z. Scheick

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Radiation performance of the L4913 voltage regulator

IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2002.1045540 ◽

2003 ◽

Cited By ~ 4

Author(s):

N. Boetti ◽

P. Jarron ◽

B. Kisielewski ◽

F. Faccio

Keyword(s):

Voltage Regulator

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High LET radiation effects microscopy for ICs

IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2002.1045548 ◽

2003 ◽

Cited By ~ 3

Author(s):

G. Vizkelethy ◽

B.L. Doyle ◽

F.D. McDaniel ◽

P. Rossi ◽

P.E. Dodd

Keyword(s):

Radiation Effects ◽

High Let Radiation ◽

High Let

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Use of COTS components for dose rate measurement from 1 krad(SiO/sub 2/)/h to 200 krad(SiO/sub 2/)/h

IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2002.1045546 ◽

2003 ◽

Author(s):

P. Chambaud ◽

C. Brisset ◽

G. Beuzelin

Keyword(s):

Dose Rate ◽

Rate Measurement

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Proton single event effects (SEE) testing of the Myrinet crossbar switch and network interface card

IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2002.1045529 ◽

2003 ◽

Cited By ~ 2

Author(s):

J.W. Howard ◽

K.A. LaBel ◽

M.A. Carts ◽

R. Stattel ◽

C.E. Rogers ◽

...

Keyword(s):

Network Interface ◽

Single Event ◽

Single Event Effects ◽

Interface Card ◽

Crossbar Switch

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Comparative analysis of low dose-rate, accelerated, and standard cobalt-60 radiation response data for a low-dropout voltage regulator and a voltage reference

IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2002.1045550 ◽

2003 ◽

Cited By ~ 11

Author(s):

W. Abare ◽

F. Brueggeman ◽

R. Pease ◽

J. Krieg ◽

M. Simons

Keyword(s):

Comparative Analysis ◽

Dose Rate ◽

Low Dose ◽

Radiation Response ◽

Voltage Regulator ◽

Voltage Reference ◽

Response Data ◽

Low Dose Rate

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Nuclear dose rate, total dose and neutron radiation testing of COTS devices

IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2002.1045545 ◽

2003 ◽

Cited By ~ 1

Author(s):

S.G. Mulford ◽

D.N. Brown ◽

A.L. McMaster

Keyword(s):

Total Dose ◽

Dose Rate ◽

Neutron Radiation ◽

Radiation Testing

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Ionizing radiation effects in EPF10K50E and XC2S150 programmable logic devices

IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2002.1045530 ◽

2003 ◽

Cited By ~ 5

Author(s):

D.M. Gingrich ◽

N.J. Buchanan ◽

L. Chen ◽

S. Liu

Keyword(s):

Ionizing Radiation ◽

Radiation Effects ◽

Programmable Logic ◽

Logic Devices ◽

Programmable Logic Devices

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Heavy ion transient characterization of a hardened-by-design active pixel sensor array

IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2002.1045552 ◽

2003 ◽

Cited By ~ 9

Author(s):

C.J. Marshall ◽

K.A. LaBel ◽

R.A. Reed ◽

P.W. Marshall ◽

W.B. Byers ◽

...

Keyword(s):

Sensor Array ◽

Heavy Ion ◽

Active Pixel Sensor ◽

Active Pixel

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Piezoresistive micromechanical transducer operation in a pulsed neutron and gamma ray environment

IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2002.1045551 ◽

2003 ◽

Cited By ~ 8

Author(s):

S.S. McCready ◽

T.H. Harlow ◽

A.S. Heger ◽

K.E. Holbert

Keyword(s):

Gamma Ray ◽

Pulsed Neutron

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