2016 21th IEEE European Test Symposium (ETS)
Latest Publications

TOTAL DOCUMENTS

61

(FIVE YEARS 0)

H-INDEX

8

(FIVE YEARS 0)

Published By IEEE

9781467396592

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

CPE: Codeword Prediction Encoder

2016 21th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2016.7519283 ◽

2016 ◽

Cited By ~ 1

Author(s):

Satish Grandhi ◽

Elsa Dupraz ◽

Christian Spagnol ◽

Valentin Savin ◽

Emanuel Popovici

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Cell Aware and stuck-open tests

2016 21th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2016.7519316 ◽

2016 ◽

Cited By ~ 10

Author(s):

Adit D. Singh

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IEEE Std P1838: DfT standard-under-development for 2.5D-, 3D-, and 5.5D-SICs

2016 21th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2016.7519330 ◽

2016 ◽

Cited By ~ 8

Author(s):

Erik Jan Marinissen ◽

Teresa McLaurin ◽

Hailong Jiao

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ETS 2016 steering and program committees

2016 21th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2016.7519277 ◽

2016 ◽

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A low-cost susceptibility analysis methodology to selectively harden logic circuits

2016 21th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2016.7519296 ◽

2016 ◽

Cited By ~ 2

Author(s):

I. Wali ◽

B. Deveautour ◽

A. Virazel ◽

A. Bosio ◽

P. Girard ◽

...

Keyword(s):

Low Cost ◽

Logic Circuits ◽

Susceptibility Analysis ◽

Analysis Methodology

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A 40Gbps economic extension board and FPGA-based testing platform

2016 21th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2016.7519297 ◽

2016 ◽

Author(s):

Te-Hui Chen ◽

David C. Keezer

Keyword(s):

Testing Platform

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VecTHOR: Low-cost compression architecture for IEEE 1149-compliant TAP controllers

2016 21th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2016.7519303 ◽

2016 ◽

Cited By ~ 3

Author(s):

Sebastian Huhn ◽

Stephan Eggersgluss ◽

Rolf Drechsler

Keyword(s):

Low Cost

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Securely connected vehicles - what it takes to make self-driving cars a reality

2016 21th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2016.7519280 ◽

2016 ◽

Cited By ~ 3

Author(s):

Lars Reger

Keyword(s):

Connected Vehicles ◽

Self Driving Cars

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A novel test generation and application flow for functional access to IEEE 1687 instruments

2016 21th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2016.7519302 ◽

2016 ◽

Cited By ~ 9

Author(s):

Michele Portolan

Keyword(s):

Test Generation

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2016 21th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2016.7519272 ◽

2016 ◽

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