Micro- and Nanoelectronics
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Published By CRC Press

9781315215457
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Elements of Carbon Electronics

2018 ◽  
pp. 318-319
Author(s):  
MISSING-VALUE MISSING-VALUE
Keyword(s):  
Carbon Electronics

Reliability Issues in Planar and Nonplanar (FinFET) Device Architectures

2017 ◽  
pp. 137-155
Author(s):  
Barry P. Linder ◽  
Eduard A. Cartier ◽  
Siddarth A. Krishnan ◽  
Chunyan E. Tian ◽  
Vijay Narayanan

FinFETs

2017 ◽  
pp. 113-136
Author(s):  
Witek P. Maszara

Fully Depleted SOI Technology Overview

2017 ◽  
pp. 95-112
Author(s):  
Bich-Yen Nguyen ◽  
Frederic Allibert ◽  
Christophe Maleville ◽  
Walter Schwarzenbach ◽  
Carlos Mazure
Keyword(s):  
Fully Depleted ◽  
Soi Technology

Fully Depleted Devices

2017 ◽  
pp. 71-94
Author(s):  
Bruce Doris ◽  
Ali Khakifirooz ◽  
Kangguo Cheng ◽  
Terence Hook
Keyword(s):  
Fully Depleted

Stateful STT-MRAM-Based Logic for Beyond–Von Neumann Computing

2017 ◽  
pp. 221-249
Author(s):  
Hiwa Mahmoudi ◽  
Thomas Windbacher ◽  
Viktor Sverdlov ◽  
Siegfried Selberherr
Keyword(s):  
Von Neumann

High-Mobility Channels

2017 ◽  
pp. 157-184
Author(s):  
Nadine Collaert
Keyword(s):  
High Mobility

SiC MOS Devices

2017 ◽  
pp. 51-68
Author(s):  
P. M. Mooney ◽  
A. F. Basile
Keyword(s):  
Mos Devices

Graphene Nanosheet as Ultrathin Barrier

2017 ◽  
pp. 343-355
Author(s):  
Yuda Zhao ◽  
Yang Chai
Keyword(s):  
Graphene Nanosheet
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