Springer Series in Solid-State Sciences - Polycrystalline Semiconductors
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Published By Springer Berlin Heidelberg

9783642824432, 9783642824418

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The Geometrical Character of Extended Interfacial Defects in Semiconducting Materials

Springer Series in Solid-State Sciences - Polycrystalline Semiconductors ◽

10.1007/978-3-642-82441-8_3 ◽

1985 ◽

pp. 27-45 ◽

Cited By ~ 2

Author(s):

R. C. Pond

Keyword(s):

Semiconducting Materials ◽

Interfacial Defects ◽

Geometrical Character

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Beam Induced Current Characterization in Polycrystalline Semiconductors

Springer Series in Solid-State Sciences - Polycrystalline Semiconductors ◽

10.1007/978-3-642-82441-8_8 ◽

1985 ◽

pp. 138-154 ◽

Cited By ~ 7

Author(s):

C. Donolato

Keyword(s):

Induced Current ◽

Polycrystalline Semiconductors

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The Electrical Properties of Oxides Under Conditions of Oxidation, Reduction and Catalysis

Springer Series in Solid-State Sciences - Polycrystalline Semiconductors ◽

10.1007/978-3-642-82441-8_12 ◽

1985 ◽

pp. 209-227 ◽

Cited By ~ 1

Author(s):

S. Strässler ◽

A. Reis ◽

D. Wieser

Keyword(s):

Electrical Properties ◽

Oxidation Reduction

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Optical Properties of Polycrystalline Silicon Films

Springer Series in Solid-State Sciences - Polycrystalline Semiconductors ◽

10.1007/978-3-642-82441-8_9 ◽

1985 ◽

pp. 156-169 ◽

Cited By ~ 15

Author(s):

Günther Harbeke

Keyword(s):

Optical Properties ◽

Polycrystalline Silicon ◽

Silicon Films ◽

Polycrystalline Silicon Films

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Electronic Properties of Grain Boundaries

Springer Series in Solid-State Sciences - Polycrystalline Semiconductors ◽

10.1007/978-3-642-82441-8_5 ◽

1985 ◽

pp. 76-94 ◽

Cited By ~ 18

Author(s):

Jürgen Werner

Keyword(s):

Grain Boundaries ◽

Electronic Properties

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Electronic States at Grain Boundaries in Semiconductors

Springer Series in Solid-State Sciences - Polycrystalline Semiconductors ◽

10.1007/978-3-642-82441-8_6 ◽

1985 ◽

pp. 95-117 ◽

Cited By ~ 6

Author(s):

A. Broniatowski

Keyword(s):

Grain Boundaries ◽

Electronic States

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Atomic Structure of Grain Boundaries

Springer Series in Solid-State Sciences - Polycrystalline Semiconductors ◽

10.1007/978-3-642-82441-8_1 ◽

1985 ◽

pp. 2-17 ◽

Cited By ~ 6

Author(s):

A. Bourret

Keyword(s):

Grain Boundaries ◽

Atomic Structure

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Electrical Properties of Grain Boundaries in the Presence of Deep Bulk Traps

Springer Series in Solid-State Sciences - Polycrystalline Semiconductors ◽

10.1007/978-3-642-82441-8_7 ◽

1985 ◽

pp. 118-137 ◽

Cited By ~ 6

Author(s):

G. Blatter ◽

F. Greuter

Keyword(s):

Electrical Properties ◽

Grain Boundaries

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Grain Boundary Segregation. Grain Boundary Diffusion

Springer Series in Solid-State Sciences - Polycrystalline Semiconductors ◽

10.1007/978-3-642-82441-8_4 ◽

1985 ◽

pp. 47-74 ◽

Cited By ~ 4

Author(s):

Marc Aucouturier

Keyword(s):

Grain Boundary ◽

Boundary Diffusion ◽

Boundary Segregation ◽

Grain Boundary Diffusion ◽

Grain Boundary Segregation

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Evolution of Physical Models for ZnO-Varistors

Springer Series in Solid-State Sciences - Polycrystalline Semiconductors ◽

10.1007/978-3-642-82441-8_13 ◽

1985 ◽

pp. 228-244 ◽

Cited By ~ 1

Author(s):

Richard Einzinger

Keyword(s):

Physical Models ◽

Zno Varistors

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Springer Series in Solid-State Sciences - Polycrystalline SemiconductorsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

The Geometrical Character of Extended Interfacial Defects in Semiconducting Materials

Beam Induced Current Characterization in Polycrystalline Semiconductors

The Electrical Properties of Oxides Under Conditions of Oxidation, Reduction and Catalysis

Optical Properties of Polycrystalline Silicon Films

Electronic Properties of Grain Boundaries

Electronic States at Grain Boundaries in Semiconductors

Atomic Structure of Grain Boundaries

Electrical Properties of Grain Boundaries in the Presence of Deep Bulk Traps

Grain Boundary Segregation. Grain Boundary Diffusion

Evolution of Physical Models for ZnO-Varistors

Springer Series in Solid-State Sciences - Polycrystalline Semiconductors
Latest Publications