2007 IEEE International Workshop on Memory Technology, Design and Testing
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781424416561

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A novel poly-Si nanowire TFT for nonvolatile memory applications

2007 IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2007.4547618 ◽

2007 ◽

Author(s):

Hsin-Hwei Hsu ◽

Horng-Chih Lin ◽

Jian-Fu Huang ◽

Tiao-Yuan Huang

Keyword(s):

Nonvolatile Memory ◽

Si Nanowire ◽

Memory Applications

Download Full-text

Vulnerability analysis of secure USB flash drives

2007 IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2007.4547620 ◽

2007 ◽

Cited By ~ 5

Author(s):

Hanjae Jeong ◽

Younsung Choi ◽

Woongryel Jeon ◽

Fei Yang ◽

Yunho Lee ◽

...

Keyword(s):

Vulnerability Analysis

Download Full-text

Embedded SRAM trend in nano-scale CMOS

2007 IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2007.4547608 ◽

2007 ◽

Cited By ~ 7

Author(s):

Hiroyuki Yamauchi

Keyword(s):

Nano Scale ◽

Embedded Sram

Download Full-text

Message from the General Chairs

2007 IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2007.4547600 ◽

2007 ◽

Download Full-text

The polarity dependence of ONO thickness for wrapped-select-gate (WSG) SONOS memory

2007 IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2007.4547617 ◽

2007 ◽

Author(s):

Kuan-Ti Wang ◽

Tien-Sheng Chao ◽

Woei-Cherng Wu ◽

Chao-Sung Lai

Download Full-text

Future challenges and opportunities of the memory industry

2007 IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2007.4547602 ◽

2007 ◽

Author(s):

Changhyun Kim

Keyword(s):

Challenges And Opportunities ◽

Future Challenges

Download Full-text

Power-gating current test for static RAM in nanotechnologies

2007 IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2007.4547614 ◽

2007 ◽

Author(s):

Yuan-Wei Chao ◽

Hsin-Ling Chen ◽

Chih-Jong Chen ◽

Tsung-Chu Huang

Keyword(s):

Power Gating ◽

Gating Current ◽

Current Test ◽

Static Ram

Download Full-text

An automatic design for flash memory testing

2007 IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2007.4547615 ◽

2007 ◽

Author(s):

Wei-Lun Wang ◽

Zheng-Wei Song

Keyword(s):

Flash Memory ◽

Automatic Design ◽

Memory Testing

Download Full-text

Value creation and technological convergence by evolution of embedded non-volatile memory

2007 IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2007.4547604 ◽

2007 ◽

Cited By ~ 1

Author(s):

Hideto Hidaka

Keyword(s):

Value Creation ◽

Technological Convergence ◽

Non Volatile Memory ◽

Volatile Memory

Download Full-text

Next-generation non-volatile memory

2007 IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2007.4547616 ◽

2007 ◽

Author(s):

Ming-Jer Kao

Keyword(s):

Next Generation ◽

Non Volatile Memory ◽

Volatile Memory

Download Full-text

2007 IEEE International Workshop on Memory Technology, Design and TestingLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A novel poly-Si nanowire TFT for nonvolatile memory applications

Vulnerability analysis of secure USB flash drives

Embedded SRAM trend in nano-scale CMOS

Message from the General Chairs

The polarity dependence of ONO thickness for wrapped-select-gate (WSG) SONOS memory

Future challenges and opportunities of the memory industry

Power-gating current test for static RAM in nanotechnologies

An automatic design for flash memory testing

Value creation and technological convergence by evolution of embedded non-volatile memory

Next-generation non-volatile memory

2007 IEEE International Workshop on Memory Technology, Design and Testing
Latest Publications