2011 9th East-West Design & Test Symposium (EWDTS)
Latest Publications

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Published By IEEE

9781457719585, 9781457719578, 9781457719561

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Programmable current biasing for low noise voltage controlled oscillators

2011 9th East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2011.6116572 ◽

2011 ◽

Cited By ~ 2

Author(s):

Vazgen Melikyan ◽

Armen Durgaryan

Keyword(s):

Low Noise ◽

Noise Voltage ◽

Voltage Controlled Oscillators

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Test set compaction procedure for combinational circuits based on decomposition tree

2011 9th East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2011.6116596 ◽

2011 ◽

Cited By ~ 3

Author(s):

Valentina Andreeva

Keyword(s):

Combinational Circuits ◽

Decomposition Tree ◽

Test Set ◽

Test Set Compaction

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Design of microprogrammed controllers with address converter implemented on programmable systems with embedded memories

2011 9th East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2011.6116577 ◽

2011 ◽

Cited By ~ 2

Author(s):

Remigiusz Wisniewski ◽

Monika Wisniewska ◽

Marek Wegrzyn ◽

Norian Marranghello

Keyword(s):

Embedded Memories

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Designing ISA card with easy interface

2011 9th East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2011.6116594 ◽

2011 ◽

Author(s):

Taghi Mohamadi

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A calculation of parasitic signal components digital filtration for the retransmission meter on the basis of FPGA

2011 9th East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2011.6116591 ◽

2011 ◽

Cited By ~ 1

Author(s):

D.A. Velychko ◽

I.I. Vdovychenko

Keyword(s):

Digital Filtration ◽

Parasitic Signal

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Title page

2011 9th East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2011.6116566 ◽

2011 ◽

Keyword(s):

Title Page

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Configurable architecture for memory BIST

2011 9th East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2011.6116571 ◽

2011 ◽

Author(s):

Atieh Lotfi ◽

Parisa Kabiri ◽

Zainalabedin Navabi

Keyword(s):

Configurable Architecture

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Checkability of the digital components in safety-critical systems: Problems and solutions

2011 9th East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2011.6116606 ◽

2011 ◽

Cited By ~ 11

Author(s):

A. Drozd ◽

V. Kharchenko ◽

S. Antoshchuk ◽

J. Sulima ◽

M. Drozd

Keyword(s):

Critical Systems ◽

Safety Critical ◽

Problems And Solutions ◽

Safety Critical Systems ◽

Digital Components

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IGBT technology design and device optimization

2011 9th East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2011.6116415 ◽

2011 ◽

Author(s):

Artem Artamonov ◽

Vladislav Nelayev ◽

Ibrahim Shelibak ◽

Arkady Turtsevich

Keyword(s):

Technology Design ◽

Device Optimization

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Infrastructure for testing and diagnosing multimedia devices

2011 9th East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2011.6116423 ◽

2011 ◽

Author(s):

Vladimir Hahanov ◽

Karyna Mostova ◽

Oleksandr Paschenko

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2011 9th East-West Design & Test Symposium (EWDTS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Programmable current biasing for low noise voltage controlled oscillators

Test set compaction procedure for combinational circuits based on decomposition tree

Design of microprogrammed controllers with address converter implemented on programmable systems with embedded memories

Designing ISA card with easy interface

A calculation of parasitic signal components digital filtration for the retransmission meter on the basis of FPGA

Title page

Configurable architecture for memory BIST

Checkability of the digital components in safety-critical systems: Problems and solutions

IGBT technology design and device optimization

Infrastructure for testing and diagnosing multimedia devices

2011 9th East-West Design & Test Symposium (EWDTS)
Latest Publications