Quantitive Surface Analysis of Materials
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14

(FIVE YEARS 0)

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4

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Published By ASTM International

9780803105430

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Quantitative Comparison of the Doubly Integrated

Quantitive Surface Analysis of Materials ◽

10.1520/stp25600s ◽

2009 ◽

pp. 64-64-8

Author(s):

RW Springer ◽

TW Haas ◽

JT Grant

Keyword(s):

Quantitative Comparison

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Some Aspects of Quantitative Surface Analysis by Electron Spectroscopy for Chemical Analysis

Quantitive Surface Analysis of Materials ◽

10.1520/stp25599s ◽

2009 ◽

pp. 47-47-17 ◽

Cited By ~ 1

Author(s):

LV Phillips ◽

L Salvati ◽

WJ Carter ◽

DM Hercules

Keyword(s):

Chemical Analysis ◽

Surface Analysis ◽

Electron Spectroscopy ◽

Quantitative Surface Analysis

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Introduction

Quantitive Surface Analysis of Materials ◽

10.1520/stp25596s ◽

2009 ◽

pp. 1-1-3

Author(s):

NS McIntyre

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Index

Quantitive Surface Analysis of Materials ◽

10.1520/stp25610s ◽

2009 ◽

pp. 211-211-4

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Surface Analysis of Polymer and Glass

Quantitive Surface Analysis of Materials ◽

10.1520/stp25606s ◽

2009 ◽

pp. 164-164-18 ◽

Cited By ~ 3

Author(s):

GR Sparrow ◽

HE Mismash

Keyword(s):

Surface Analysis

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Quantitative Analysis of Alloys and Thin Films Using Ion Scattering Spectroscopy

Quantitive Surface Analysis of Materials ◽

10.1520/stp25605s ◽

2009 ◽

pp. 150-150-14 ◽

Cited By ~ 2

Author(s):

WL Baun

Keyword(s):

Thin Films ◽

Quantitative Analysis ◽

Ion Scattering ◽

Ion Scattering Spectroscopy

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Quantitative Analysis by Secondary Ion Mass Spectrometry

Quantitive Surface Analysis of Materials ◽

10.1520/stp25604s ◽

2009 ◽

pp. 127-127-22 ◽

Cited By ~ 6

Author(s):

DE Newbury

Keyword(s):

Mass Spectrometry ◽

Quantitative Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Secondary Ion

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The Use of Soft X-Ray Photoemission Spectroscopy to Study the Adsorption of Oxygen on the (110) Surface of Gallium Arsenide and Gallium Antimonide

Quantitive Surface Analysis of Materials ◽

10.1520/stp25603s ◽

2009 ◽

pp. 105-105-19

Author(s):

P Pianetta ◽

I Lindau ◽

WE Spicer

Keyword(s):

Gallium Arsenide ◽

Gallium Antimonide ◽

Photoemission Spectroscopy ◽

X Ray

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How Quantitative is Electron Spectroscopy for Chemical Analysis?—An Evaluation of the Significant Factors

Quantitive Surface Analysis of Materials ◽

10.1520/stp25598s ◽

2009 ◽

pp. 31-31-16 ◽

Cited By ~ 4

Author(s):

CD Wagner

Keyword(s):

Chemical Analysis ◽

Electron Spectroscopy ◽

Significant Factors

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Secondary Ion Mass Spectrometry and Auger Electron Spectroscopy Semiquantitative Analysis of Metal Alloys

Quantitive Surface Analysis of Materials ◽

10.1520/stp25607s ◽

2009 ◽

pp. 182-182-5

Author(s):

LE Davis ◽

RL Gerlach

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

Metal Alloys ◽

Semiquantitative Analysis ◽

Ion Mass Spectrometry ◽

Secondary Ion

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