Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and Technology
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9781402093104, 9781402093111

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Piezoelectric Resonance

Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and Technology ◽

10.1007/978-1-4020-9311-1_2 ◽

2014 ◽

pp. 15-35

Author(s):

Markys G. Cain ◽

Mark Stewart

Keyword(s):

Piezoelectric Resonance

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Direct Piezoelectric Measurement: The Berlincourt Method

Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and Technology ◽

10.1007/978-1-4020-9311-1_3 ◽

2014 ◽

pp. 37-64 ◽

Cited By ~ 4

Author(s):

Mark Stewart ◽

Markys G. Cain

Keyword(s):

Piezoelectric Measurement

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Standards for Piezoelectric and Ferroelectric Ceramics

Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and Technology ◽

10.1007/978-1-4020-9311-1_12 ◽

2014 ◽

pp. 267-275

Author(s):

Markys G. Cain ◽

Mark Stewart

Keyword(s):

Ferroelectric Ceramics

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Piezoresponse Force Micropscopy

Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and Technology ◽

10.1007/978-1-4020-9311-1_8 ◽

2014 ◽

pp. 191-219

Author(s):

Serban Lepadatu ◽

Markys G. Cain

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Electrical Measurement of Ferroelectric Properties

Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and Technology ◽

10.1007/978-1-4020-9311-1_1 ◽

2014 ◽

pp. 1-14 ◽

Cited By ~ 2

Author(s):

Mark Stewart ◽

Markys G. Cain ◽

Paul Weaver

Keyword(s):

Ferroelectric Properties ◽

Electrical Measurement

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Characterisation of Pyroelectric Materials

Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and Technology ◽

10.1007/978-1-4020-9311-1_4 ◽

2014 ◽

pp. 65-86 ◽

Cited By ~ 6

Author(s):

Roger Whatmore

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Interferometry for Piezoelectric Materials and Thin Films

Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and Technology ◽

10.1007/978-1-4020-9311-1_5 ◽

2014 ◽

pp. 87-113

Author(s):

Zhaorong Huang ◽

Glenn Leighton

Keyword(s):

Thin Films ◽

Piezoelectric Materials

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Indentation Stiffness Analysis of Ferroelectric Thin Films

Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and Technology ◽

10.1007/978-1-4020-9311-1_9 ◽

2014 ◽

pp. 221-231

Author(s):

C. Chima-Okereke ◽

M. J. Reece ◽

Markys G. Cain

Keyword(s):

Thin Films ◽

Ferroelectric Thin Films ◽

Stiffness Analysis

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Temperature Dependence of Ferroelectric and Piezoelectric Properties of PZT Ceramics

Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and Technology ◽

10.1007/978-1-4020-9311-1_6 ◽

2014 ◽

pp. 115-145

Author(s):

Paul Weaver ◽

Markys G. Cain

Keyword(s):

Temperature Dependence ◽

Piezoelectric Properties ◽

Pzt Ceramics ◽

Ferroelectric And Piezoelectric Properties

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Losses in Piezoelectrics via Complex Resonance Analysis

Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and Technology ◽

10.1007/978-1-4020-9311-1_10 ◽

2014 ◽

pp. 233-242 ◽

Cited By ~ 1

Author(s):

Markys G. Cain ◽

Mark Stewart

Keyword(s):

Resonance Analysis

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Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and TechnologyLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Netherlands

Piezoelectric Resonance

Direct Piezoelectric Measurement: The Berlincourt Method

Standards for Piezoelectric and Ferroelectric Ceramics

Piezoresponse Force Micropscopy

Electrical Measurement of Ferroelectric Properties

Characterisation of Pyroelectric Materials

Interferometry for Piezoelectric Materials and Thin Films

Indentation Stiffness Analysis of Ferroelectric Thin Films

Temperature Dependence of Ferroelectric and Piezoelectric Properties of PZT Ceramics

Losses in Piezoelectrics via Complex Resonance Analysis

Characterisation of Ferroelectric Bulk Materials and Thin Films - Springer Series in Measurement Science and Technology
Latest Publications