The Fourth International Conference on Advanced Semiconductor Devices and Microsystem
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Liquid phase silylation of Shipley SPR500A-series resists using top surface imaging

The Fourth International Conference on Advanced Semiconductor Devices and Microsystem ◽

10.1109/asdam.2002.1088469 ◽

2003 ◽

Author(s):

K. Arshak ◽

M. Mihov ◽

A. Arshak ◽

D. McDonagh ◽

D. Sutton ◽

...

Keyword(s):

Liquid Phase ◽

Surface Imaging ◽

Top Surface Imaging

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Manufacturing of pixel detectors at Tesla SEZAM

The Fourth International Conference on Advanced Semiconductor Devices and Microsystem ◽

10.1109/asdam.2002.1088543 ◽

2003 ◽

Author(s):

M. Frys ◽

S. Kapsia ◽

Z. Spetik ◽

T. Sezam ◽

R.P. Radhostem ◽

...

Keyword(s):

Pixel Detectors

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High-performance AlGaN/GaN HEMTs on silicon substrates

The Fourth International Conference on Advanced Semiconductor Devices and Microsystem ◽

10.1109/asdam.2002.1088526 ◽

2003 ◽

Author(s):

P. Javorka ◽

A. Alam ◽

A. Fox ◽

M. Marso ◽

M. Heuken ◽

...

Keyword(s):

High Performance ◽

Silicon Substrates ◽

Gan Hemts

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Modelling of the photodiode in various microwave applications

The Fourth International Conference on Advanced Semiconductor Devices and Microsystem ◽

10.1109/asdam.2002.1088512 ◽

2003 ◽

Cited By ~ 1

Author(s):

A.L. Chizh ◽

S.A. Malyshev

Keyword(s):

Microwave Applications

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Diamond and cubic boron nitride: synthesis and electronic applications

The Fourth International Conference on Advanced Semiconductor Devices and Microsystem ◽

10.1109/asdam.2002.1088463 ◽

2003 ◽

Cited By ~ 2

Author(s):

I. Bello ◽

W.J. Zhang ◽

K.M. Chan ◽

C.Y. Chan ◽

Y. Wu ◽

...

Keyword(s):

Boron Nitride ◽

Cubic Boron Nitride

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New numerical power IGBT model and simulation of its electrical characteristics

The Fourth International Conference on Advanced Semiconductor Devices and Microsystem ◽

10.1109/asdam.2002.1088509 ◽

2003 ◽

Cited By ~ 3

Author(s):

L. Benbahouche ◽

S. Latrech ◽

C. Gontrand

Keyword(s):

Electrical Characteristics ◽

Model And Simulation

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Carrier noise in mode-locked fiber grating external cavity lasers

The Fourth International Conference on Advanced Semiconductor Devices and Microsystem ◽

10.1109/asdam.2002.1088518 ◽

2003 ◽

Author(s):

N. Dogru ◽

M. Sadettin Ozyazici

Keyword(s):

External Cavity ◽

Fiber Grating ◽

External Cavity Lasers ◽

Cavity Lasers

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Microstructure of indium-tin-oxide films deposited on glass substrates

The Fourth International Conference on Advanced Semiconductor Devices and Microsystem ◽

10.1109/asdam.2002.1088493 ◽

2003 ◽

Cited By ~ 1

Author(s):

P. Sutta ◽

Q. Jackuliak

Keyword(s):

Tin Oxide ◽

Indium Tin Oxide ◽

Oxide Films ◽

Glass Substrates ◽

Tin Oxide Films

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Thermal resistance of the semiconductor structures for a photomixing device

The Fourth International Conference on Advanced Semiconductor Devices and Microsystem ◽

10.1109/asdam.2002.1088482 ◽

2003 ◽

Author(s):

J. Darmo ◽

F. Schafer ◽

A. Forster ◽

P. Kordos ◽

R. Gusten

Keyword(s):

Thermal Resistance ◽

Semiconductor Structures

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Ti Zr dielectric layers deposited by hot target reactive magnetron sputtering

The Fourth International Conference on Advanced Semiconductor Devices and Microsystem ◽

10.1109/asdam.2002.1088471 ◽

2003 ◽

Cited By ~ 1

Author(s):

J. Domaradzki ◽

E. Prociow ◽

D. Kaczmarek

Keyword(s):

Magnetron Sputtering ◽

Reactive Magnetron Sputtering ◽

Reactive Magnetron ◽

Dielectric Layers ◽

Hot Target

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The Fourth International Conference on Advanced Semiconductor Devices and MicrosystemLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Liquid phase silylation of Shipley SPR500A-series resists using top surface imaging

Manufacturing of pixel detectors at Tesla SEZAM

High-performance AlGaN/GaN HEMTs on silicon substrates

Modelling of the photodiode in various microwave applications

Diamond and cubic boron nitride: synthesis and electronic applications

New numerical power IGBT model and simulation of its electrical characteristics

Carrier noise in mode-locked fiber grating external cavity lasers

Microstructure of indium-tin-oxide films deposited on glass substrates

Thermal resistance of the semiconductor structures for a photomixing device

Ti Zr dielectric layers deposited by hot target reactive magnetron sputtering

The Fourth International Conference on Advanced Semiconductor Devices and Microsystem
Latest Publications