Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By Springer US

9781461278504, 9781461305279

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

HOLZ Diffraction from Semiconductor Superlattices

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series ◽

10.1007/978-1-4613-0527-9_6 ◽

1989 ◽

pp. 75-86 ◽

Cited By ~ 1

Author(s):

H. Gong ◽

C. D. de Haan ◽

F. W. Schapink

Keyword(s):

Semiconductor Superlattices

Download Full-text

II-VI Semiconductor Interfaces

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series ◽

10.1007/978-1-4613-0527-9_3 ◽

1989 ◽

pp. 33-45 ◽

Cited By ~ 3

Author(s):

G. Feuillet

Keyword(s):

Semiconductor Interfaces

Download Full-text

Defect Structure in Low and High Misfit Systems

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series ◽

10.1007/978-1-4613-0527-9_27 ◽

1989 ◽

pp. 369-380 ◽

Cited By ~ 2

Author(s):

Horst P. Strunk

Keyword(s):

Defect Structure

Download Full-text

The Microstructure of GaAs/Si Films Studies as a Function of Heat Treatment

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series ◽

10.1007/978-1-4613-0527-9_25 ◽

1989 ◽

pp. 347-354

Author(s):

A. Rocher ◽

H. Heral ◽

M. N. Charasse ◽

A. Georgakilas ◽

J. Chazelas ◽

...

Keyword(s):

Heat Treatment ◽

Si Films

Download Full-text

EBIC Studies of Individual Defects in Lightly Doped Semiconductors: CdTe as an Example

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series ◽

10.1007/978-1-4613-0527-9_11 ◽

1989 ◽

pp. 143-157

Author(s):

B. Sieber

Keyword(s):

Doped Semiconductors

Download Full-text

TEM-Cathodoluminescence Study of Single and Multiple Quantum Wells of MBE Grown GaAs/AlGaAs

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series ◽

10.1007/978-1-4613-0527-9_10 ◽

1989 ◽

pp. 127-141

Author(s):

J. W. Steeds ◽

S. J. Bailey ◽

J. N. Wang ◽

C. W. Tu

Keyword(s):

Quantum Wells ◽

Multiple Quantum Wells ◽

Multiple Quantum ◽

Cathodoluminescence Study

Download Full-text

Surface and Thin Film Growth Studied by Reflection High Energy Electron Diffraction

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series ◽

10.1007/978-1-4613-0527-9_19 ◽

1989 ◽

pp. 267-282 ◽

Cited By ~ 1

Author(s):

P. J. Dobson

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Film Growth ◽

High Energy ◽

Thin Film Growth ◽

Energy Electron ◽

High Energy Electron

Download Full-text

Summary of Discussion on Instrumental Requirements for the Evaluation of Advanced Semiconductor Materials by Electron Microscopy

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series ◽

10.1007/978-1-4613-0527-9_30 ◽

1989 ◽

pp. 403-407

Author(s):

J. M. Gibson

Keyword(s):

Electron Microscopy ◽

Semiconductor Materials

Download Full-text

Misfit Dislocations in Inx Ga1-xAs/GaAs Heterostructures near the Critical Thickness

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series ◽

10.1007/978-1-4613-0527-9_29 ◽

1989 ◽

pp. 395-402 ◽

Cited By ~ 1

Author(s):

D. Cockayne ◽

P. Orders ◽

A. Sikorski ◽

B. Usher ◽

J. Zhou

Keyword(s):

Critical Thickness ◽

Misfit Dislocations

Download Full-text

In-Situ Electron Microscope Studies of Misfit Dislocation Introduction into GexSi1-x/Si Heterostructures

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series ◽

10.1007/978-1-4613-0527-9_28 ◽

1989 ◽

pp. 381-394

Author(s):

R. Hull ◽

J. C. Bean ◽

D. Bahnck ◽

J. M. Bonar ◽

C. Buescher

Keyword(s):

Electron Microscope ◽

Misfit Dislocation

Download Full-text

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI SeriesLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer US

HOLZ Diffraction from Semiconductor Superlattices

II-VI Semiconductor Interfaces

Defect Structure in Low and High Misfit Systems

The Microstructure of GaAs/Si Films Studies as a Function of Heat Treatment

EBIC Studies of Individual Defects in Lightly Doped Semiconductors: CdTe as an Example

TEM-Cathodoluminescence Study of Single and Multiple Quantum Wells of MBE Grown GaAs/AlGaAs

Surface and Thin Film Growth Studied by Reflection High Energy Electron Diffraction

Summary of Discussion on Instrumental Requirements for the Evaluation of Advanced Semiconductor Materials by Electron Microscopy

Misfit Dislocations in Inx Ga1-xAs/GaAs Heterostructures near the Critical Thickness

In-Situ Electron Microscope Studies of Misfit Dislocation Introduction into GexSi1-x/Si Heterostructures

Evaluation of Advanced Semiconductor Materials by Electron Microscopy - NATO ASI Series
Latest Publications