Introduction to Focused Ion Beams
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9780387231167, 9780387233130
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High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy

2005 ◽  
pp. 133-142
Author(s):  
Peter Gnauck ◽  
Peter Hoffrogge ◽  
M. Schumann
Keyword(s):  
High Resolution ◽  
Live Imaging

Dual-Beam (FIB-SEM) Systems

2005 ◽  
pp. 247-268 ◽  
Author(s):  
Richard J. Young ◽  
Mary V. Moore
Keyword(s):  
Dual Beam

FIB Lift-Out Specimen Preparation Techniques

2005 ◽  
pp. 201-228 ◽  
Author(s):  
L. A. Giannuzzi ◽  
B. W. Kempshall ◽  
S. M. Schwarz ◽  
J. K. Lomness ◽  
B. I. Prenitzer ◽  
...  
Keyword(s):  
Specimen Preparation ◽  
Preparation Techniques

Ion - Solid Interactions

2005 ◽  
pp. 13-52 ◽  
Author(s):  
Lucille A. Giannuzzi ◽  
Brenda I. Prenitzer ◽  
Brian W. Kempshall

Practical Aspects of FIB Tem Specimen Preparation

2005 ◽  
pp. 173-200 ◽  
Author(s):  
Ron Anderson ◽  
Stanley J. Klepeis
Keyword(s):  
Specimen Preparation

The Focused Ion Beam Instrument

2005 ◽  
pp. 1-12 ◽  
Author(s):  
F. A. Stevie ◽  
L. A. Giannuzzi ◽  
B. I. Prenitzer
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Instrument

Device Edits and Modifications

2005 ◽  
pp. 87-106 ◽  
Author(s):  
Kultaransingh Bobby N. Hooghan

A FIB Micro-Sampling Technique and a Site Specific TEM Specimen Preparation Method

2005 ◽  
pp. 229-245 ◽  
Author(s):  
T. Kamino ◽  
T. Yaguchi ◽  
T. Hashimoto ◽  
T. Ohnishi ◽  
K. Umemura
Keyword(s):  
Preparation Method ◽  
Sampling Technique ◽  
Specimen Preparation ◽  
Site Specific ◽  
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