ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005.
Latest Publications

TOTAL DOCUMENTS

141

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

0780391438

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

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ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. ◽

10.1109/issm.2005.1513284 ◽

2005 ◽

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Manufacturing operations improvement with loop management

ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. ◽

10.1109/issm.2005.1513289 ◽

2005 ◽

Cited By ~ 1

Author(s):

G.R. Chacon ◽

F. Ballejo ◽

S. James ◽

C. Manuel ◽

C. Love ◽

...

Keyword(s):

Manufacturing Operations

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A breakthrough in optimizing throughput and manufacturing efficiency via factory-wide dynamic WIP dispatching in 300mm semiconductor manufacturing

ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. ◽

10.1109/issm.2005.1513291 ◽

2005 ◽

Author(s):

Bo Li ◽

J. Wu ◽

M.P. Herring ◽

C. Mouli

Keyword(s):

Semiconductor Manufacturing ◽

Manufacturing Efficiency

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Study on reliability of metal fuse for sub-100nm technology

ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. ◽

10.1109/issm.2005.1513394 ◽

2005 ◽

Cited By ~ 1

Author(s):

D. Park ◽

Chang-Suk Hyun ◽

Hyun-Chul Kim ◽

Hyuck-Jin Kang ◽

Kang-Yoon Lee ◽

...

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Evaluate simulation design alternatives for large scale manufacturing systems

ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. ◽

10.1109/issm.2005.1513373 ◽

2005 ◽

Cited By ~ 5

Author(s):

L.F. McGinnis ◽

Sheng Xu ◽

Ke Wang

Keyword(s):

Manufacturing Systems ◽

Large Scale ◽

Simulation Design ◽

Design Alternatives

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ISSM 2005 sponsoring organizations

ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. ◽

10.1109/issm.2005.1513280 ◽

2005 ◽

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Challenges for inline elemental characterization at 65 nm node and beyond

ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. ◽

10.1109/issm.2005.1513413 ◽

2005 ◽

Author(s):

M. Godwin

Keyword(s):

Elemental Characterization

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Pattern of vertical engineering collaboration between foundry and design service provider

ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. ◽

10.1109/issm.2005.1513378 ◽

2005 ◽

Cited By ~ 1

Author(s):

Yea-Huey Su ◽

Ruey-Shan Guo ◽

Chia-Hsien Hsiao

Keyword(s):

Service Provider ◽

Engineering Collaboration

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Study for Realizing Effective Direct Tool-to-Tool Delivery

ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. ◽

10.1109/issm.2005.1513286 ◽

2005 ◽

Cited By ~ 1

Author(s):

H. Kondo ◽

M. Harada

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A multivariate statistical analysis of tool parameters to improve an erase failure of a flash memory device

ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. ◽

10.1109/issm.2005.1513316 ◽

2005 ◽

Cited By ~ 1

Author(s):

K. Miwa ◽

K. Watanabe ◽

K. Takeishi ◽

T. Kobayashi ◽

K. Imaoka

Keyword(s):

Statistical Analysis ◽

Flash Memory ◽

Multivariate Statistical Analysis ◽

Memory Device ◽

Multivariate Statistical

Download Full-text

ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005.Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Breaker page

Manufacturing operations improvement with loop management

A breakthrough in optimizing throughput and manufacturing efficiency via factory-wide dynamic WIP dispatching in 300mm semiconductor manufacturing

Study on reliability of metal fuse for sub-100nm technology

Evaluate simulation design alternatives for large scale manufacturing systems

ISSM 2005 sponsoring organizations

Challenges for inline elemental characterization at 65 nm node and beyond

Pattern of vertical engineering collaboration between foundry and design service provider

Study for Realizing Effective Direct Tool-to-Tool Delivery

A multivariate statistical analysis of tool parameters to improve an erase failure of a flash memory device

ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005.
Latest Publications