Advanced Test Methods for SRAMs
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9781441909374, 9781441909381
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Diagnosis and Design-for-Diagnosis

2009 ◽  
pp. 133-158
Author(s):  
Patrick Girard ◽  
Alberto Bosio ◽  
Luigi Dilillo ◽  
Serge Pravossoudovitch ◽  
Arnaud Virazel

Resistive-Open Defects in Write Drivers

2009 ◽  
pp. 81-97
Author(s):  
Patrick Girard ◽  
Alberto Bosio ◽  
Luigi Dilillo ◽  
Serge Pravossoudovitch ◽  
Arnaud Virazel
Keyword(s):  
Open Defects ◽  
Resistive Open Defects

Resistive-Open Defects in Pre-charge Circuits

2009 ◽  
pp. 49-64
Author(s):  
Patrick Girard ◽  
Alberto Bosio ◽  
Luigi Dilillo ◽  
Serge Pravossoudovitch ◽  
Arnaud Virazel
Keyword(s):  
Open Defects ◽  
Resistive Open Defects

Faults Due to Process Variations in SRAMs

2009 ◽  
pp. 115-132
Author(s):  
Patrick Girard ◽  
Alberto Bosio ◽  
Luigi Dilillo ◽  
Serge Pravossoudovitch ◽  
Arnaud Virazel
Keyword(s):  
Process Variations

Resistive-Open Defects in Address Decoders

2009 ◽  
pp. 65-80
Author(s):  
Patrick Girard ◽  
Alberto Bosio ◽  
Luigi Dilillo ◽  
Serge Pravossoudovitch ◽  
Arnaud Virazel
Keyword(s):  
Open Defects ◽  
Address Decoders ◽  
Resistive Open Defects

Resistive-Open Defects in Core-Cells

2009 ◽  
pp. 21-48 ◽  
Author(s):  
Patrick Girard ◽  
Alberto Bosio ◽  
Luigi Dilillo ◽  
Serge Pravossoudovitch ◽  
Arnaud Virazel
Keyword(s):  
Open Defects ◽  
Resistive Open Defects

Resistive-Open Defects in Sense Amplifiers

2009 ◽  
pp. 99-114
Author(s):  
Patrick Girard ◽  
Alberto Bosio ◽  
Luigi Dilillo ◽  
Serge Pravossoudovitch ◽  
Arnaud Virazel
Keyword(s):  
Open Defects ◽  
Sense Amplifiers ◽  
Resistive Open Defects

Basics on SRAM Testing

2009 ◽  
pp. 1-19 ◽  
Author(s):  
Patrick Girard ◽  
Alberto Bosio ◽  
Luigi Dilillo ◽  
Serge Pravossoudovitch ◽  
Arnaud Virazel
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