Particles on Surfaces 2
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TOTAL DOCUMENTS

25

(FIVE YEARS 0)

H-INDEX

3

(FIVE YEARS 0)

Published By Springer US

9781461278528, 9781461305316

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Adhesion of Ash Particles on Heat Transfer Surfaces in Coal Combustion Applications: Mechanisms and Implications

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_8 ◽

1989 ◽

pp. 87-97

Author(s):

R. Nagarajan

Keyword(s):

Heat Transfer ◽

Coal Combustion

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Particle Reduction on Silicon Wafers as a Result of Isopropyl Alcohol Vapor Displacement drying after Wet Processing

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_19 ◽

1989 ◽

pp. 235-243 ◽

Cited By ~ 1

Author(s):

Joan W. Koppenbrink ◽

Christopher F. McConnell ◽

Alan E. Walter

Keyword(s):

Isopropyl Alcohol ◽

Silicon Wafers ◽

Alcohol Vapor ◽

Wet Processing

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Wear Resistant Coatings Reduce Particulate Contamination in a Magnetic Disk Drive

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_18 ◽

1989 ◽

pp. 217-234

Author(s):

Wendy Jones ◽

John McDowell ◽

Walter Prater ◽

Garvin Stone

Keyword(s):

Disk Drive ◽

Wear Resistant ◽

Magnetic Disk ◽

Wear Resistant Coatings ◽

Particulate Contamination

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The Evaluation of PWA and SMA Cleanliness Levels for “In-Line” Defluxing by High Performance Liquid Chromatography

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_17 ◽

1989 ◽

pp. 201-213

Author(s):

R. F. Klima ◽

J. K. Bonner

Keyword(s):

High Performance Liquid Chromatography ◽

Liquid Chromatography ◽

High Performance

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Surface Particle Inspection Plans in Semiconductor Manufacturing

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_14 ◽

1989 ◽

pp. 181-188

Author(s):

Zinovy Fichtenholz ◽

Leon L. Pesotchinsky

Keyword(s):

Semiconductor Manufacturing ◽

Surface Particle

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The Role of Infrared and Raman Microspectroscopies in the Characterization of Particles on Surfaces

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_10 ◽

1989 ◽

pp. 115-142 ◽

Cited By ~ 1

Author(s):

Kenneth J. Ward ◽

David R. Tallant

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Ultrasonic and Hydrodynamic Techniques for Particle Removal from Silicon Wafers

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_24 ◽

1989 ◽

pp. 297-306 ◽

Cited By ~ 3

Author(s):

V. B. Menon ◽

L. D. Michaels ◽

R. P. Donovan ◽

D. S. Ensor

Keyword(s):

Silicon Wafers ◽

Particle Removal

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The Effect of External Noises on the Attachment of Particles to Solid Surfaces

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_5 ◽

1989 ◽

pp. 59-66

Author(s):

J. P. Hsu

Keyword(s):

Solid Surfaces

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Implications of Particulate Contamination in E-Beam Lithography

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_21 ◽

1989 ◽

pp. 253-265 ◽

Cited By ~ 1

Author(s):

Robert L. Dean

Keyword(s):

Particulate Contamination

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Particulate Generation and Detection on Surfaces

Particles on Surfaces 2 ◽

10.1007/978-1-4613-0531-6_15 ◽

1989 ◽

pp. 189-194

Author(s):

Marvin Fein

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