2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04
Latest Publications

TOTAL DOCUMENTS

102

(FIVE YEARS 0)

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(FIVE YEARS 0)

Published By IEEE

0780384970

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Complementary sidewall-spacer-diffused ultrashallow SD extension process for damascene independently-double-gated SOI CMOS

2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04 ◽

10.1109/soi.2004.1391575 ◽

2005 ◽

Cited By ~ 5

Author(s):

S. Parke ◽

M. Goldston ◽

D. Hackler ◽

K. DeGregorio ◽

R. Hayhurst ◽

...

Keyword(s):

Extension Process ◽

Soi Cmos

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New insights on the hot-carrier characteristics of 55 nm PD SOI MOSFETs

2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04 ◽

10.1109/soi.2004.1391618 ◽

2005 ◽

Author(s):

D.P. Ioannou ◽

E. Zhao ◽

S. Cooper ◽

J. Zhang ◽

S.K. Jayanarayanan ◽

...

Keyword(s):

Hot Carrier

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Impact of gate underlap on gate capacitance and gate tunneling current in 16 nm DGMOS devices

2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04 ◽

10.1109/soi.2004.1391570 ◽

2005 ◽

Cited By ~ 18

Author(s):

A. Bansal ◽

B.C. Paul ◽

K. Roy

Keyword(s):

Tunneling Current ◽

Gate Capacitance ◽

Gate Tunneling ◽

Gate Underlap

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Germanium-on-insulator (GeOI) structures realized by the Smart Cut/spl trade/ technology

2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04 ◽

10.1109/soi.2004.1391571 ◽

2005 ◽

Cited By ~ 3

Author(s):

C. Deguet ◽

C. Morales ◽

J. Dechamp ◽

J.M. Hartmann ◽

A.M. Charvet ◽

...

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History-effect-conscious SPICE model extraction for PD-SOI technology

2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04 ◽

10.1109/soi.2004.1391597 ◽

2005 ◽

Cited By ~ 1

Author(s):

J.-S. Goo ◽

J.X. An ◽

C. Thuruthiyil ◽

T. Ly ◽

Q. Chen ◽

...

Keyword(s):

Model Extraction ◽

Spice Model ◽

History Effect ◽

Soi Technology

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Strained-Si/SiGe-on-insulator wafers fabricated by Ge-condensation process

2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04 ◽

10.1109/soi.2004.1391591 ◽

2005 ◽

Cited By ~ 2

Author(s):

N. Hirashita ◽

T. Numata ◽

T. Tezuka ◽

N. Sugiyama ◽

K. Usuda ◽

...

Keyword(s):

Condensation Process ◽

Strained Si

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Alternative dielectrics for advanced SOI MOSFETs: thermal properties and short channel effects

2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04 ◽

10.1109/soi.2004.1391556 ◽

2005 ◽

Cited By ~ 3

Author(s):

N. Bresson ◽

S. Cristoloveanu ◽

K. Oshima ◽

C. Mazure ◽

F. Letertre ◽

...

Keyword(s):

Thermal Properties ◽

Short Channel Effects ◽

Short Channel ◽

Channel Effects

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Unusual floating body effect in fully depleted MOSFETs

2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04 ◽

10.1109/soi.2004.1391595 ◽

2005 ◽

Cited By ~ 5

Author(s):

M. Bawedin ◽

S. Cristoloveanu ◽

D. Flandre

Keyword(s):

Floating Body ◽

Body Effect ◽

Fully Depleted ◽

Floating Body Effect

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Crystal-direction dependence of uniaxial tensile strain in ultra-thin SOI

2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04 ◽

10.1109/soi.2004.1391546 ◽

2005 ◽

Author(s):

R.L. Peterson ◽

K.D. Hobart ◽

H. Yin ◽

J.C. Sturm

Keyword(s):

Tensile Strain ◽

Uniaxial Tensile ◽

Crystal Direction ◽

Direction Dependence

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Fabrication of strained Si/strained SiGe/strained Si heterostructures on insulator by a bond and etch-back technique

2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04 ◽

10.1109/soi.2004.1391544 ◽

2005 ◽

Cited By ~ 1

Author(s):

I. Aberg ◽

O.O. Olubuyide ◽

J. Li ◽

R. Hull ◽

J.L. Hoyt

Keyword(s):

Strained Si ◽

Strained Sige

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2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Complementary sidewall-spacer-diffused ultrashallow SD extension process for damascene independently-double-gated SOI CMOS

New insights on the hot-carrier characteristics of 55 nm PD SOI MOSFETs

Impact of gate underlap on gate capacitance and gate tunneling current in 16 nm DGMOS devices

Germanium-on-insulator (GeOI) structures realized by the Smart Cut/spl trade/ technology

History-effect-conscious SPICE model extraction for PD-SOI technology

Strained-Si/SiGe-on-insulator wafers fabricated by Ge-condensation process

Alternative dielectrics for advanced SOI MOSFETs: thermal properties and short channel effects

Unusual floating body effect in fully depleted MOSFETs

Crystal-direction dependence of uniaxial tensile strain in ultra-thin SOI

Fabrication of strained Si/strained SiGe/strained Si heterostructures on insulator by a bond and etch-back technique

2004 IEEE International SOI Conference (IEEE Cat No 04CH37573) SOI-04
Latest Publications