2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774)
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Terrestrial solar cells in space [radiation tolerance]

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352919 ◽

2005 ◽

Cited By ~ 2

Author(s):

T. Sumita ◽

M. Imaizumi ◽

S. Kawakita ◽

S. Matsuda ◽

S. Kuwajima

Keyword(s):

Solar Cells ◽

Space Radiation ◽

Radiation Tolerance

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A radiation-hardened high-precision resolver-to-digital converter (RDC)

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352913 ◽

2005 ◽

Cited By ~ 2

Author(s):

N. Nowlin ◽

S. McEndree ◽

D. Butcher

Keyword(s):

High Precision ◽

Digital Converter ◽

Radiation Hardened

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Total dose effects and SEE screening on MEMS COTS accelerometers

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352918 ◽

2005 ◽

Cited By ~ 1

Author(s):

O. Cournar ◽

F. Miller ◽

N. Buard ◽

P. Poirot ◽

R. Gaillard ◽

...

Keyword(s):

Total Dose ◽

Dose Effects ◽

Total Dose Effects

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Radiation lot acceptance testing (RLAT) at high and low dose rates with neutron pre-dosing [microcircuits]

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352900 ◽

2005 ◽

Cited By ~ 1

Author(s):

B.A. Posey ◽

S. Renfrow ◽

M. Davis ◽

R. Steinbach ◽

D. Morgan

Keyword(s):

Low Dose ◽

Acceptance Testing ◽

Dose Rates

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Current total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352898 ◽

2005 ◽

Cited By ~ 1

Author(s):

D.J. Cochran ◽

S.P. Buchner ◽

T.L. Irwin ◽

S.D. Kniffin ◽

R.L. Ladbury ◽

...

Keyword(s):

Total Ionizing Dose ◽

Displacement Damage

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Evolution of lowest supply voltage and hysteresis phenomena in irradiated analog CMOS switches

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352912 ◽

2005 ◽

Cited By ~ 3

Author(s):

F.J. Franco ◽

Y. Zong ◽

J.A. Agapito ◽

J. Casas-Cubillos ◽

M.A. Rodriguez-Ruiz

Keyword(s):

Supply Voltage ◽

Analog Cmos ◽

Hysteresis Phenomena

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Test results of total ionizing dose conducted at the Jet Propulsion Laboratory [bipolar and CMOS ICs]

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352901 ◽

2005 ◽

Cited By ~ 1

Author(s):

R.M. Rivas ◽

A.H. Johnston ◽

T.F. Miyahira ◽

B.G. Rax ◽

M.D. Wiedeman

Keyword(s):

Test Results ◽

Total Ionizing Dose ◽

Jet Propulsion ◽

Jet Propulsion Laboratory

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Compendia of TID and SEE test results of integrated circuits

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352896 ◽

2005 ◽

Cited By ~ 4

Author(s):

P. Layton ◽

G. Williamson ◽

C. Gilbert ◽

L. Longden ◽

E. Patnaude ◽

...

Keyword(s):

Integrated Circuits ◽

Test Results

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Angular effects in proton-induced single-event upsets in silicon-on-sapphire and silicon-on-insulator devices

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352916 ◽

2005 ◽

Cited By ~ 2

Author(s):

S.D. Kniffin ◽

J.F. McCabe ◽

G.A. Gardner ◽

J. Lintz ◽

C. Ross ◽

...

Keyword(s):

Silicon On Insulator ◽

Single Event ◽

Single Event Upsets

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Beam properties of the new radiation effects research stations at Indiana University Cyclotron Facility

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) ◽

10.1109/redw.2004.1352921 ◽

2005 ◽

Cited By ~ 7

Author(s):

B. von Przewoski ◽

T. Rinckel ◽

W. Manwaring ◽

G. Broxton ◽

M. Chipara ◽

...

Keyword(s):

Radiation Effects ◽

Indiana University

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2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Terrestrial solar cells in space [radiation tolerance]

A radiation-hardened high-precision resolver-to-digital converter (RDC)

Total dose effects and SEE screening on MEMS COTS accelerometers

Radiation lot acceptance testing (RLAT) at high and low dose rates with neutron pre-dosing [microcircuits]

Current total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA

Evolution of lowest supply voltage and hysteresis phenomena in irradiated analog CMOS switches

Test results of total ionizing dose conducted at the Jet Propulsion Laboratory [bipolar and CMOS ICs]

Compendia of TID and SEE test results of integrated circuits

Angular effects in proton-induced single-event upsets in silicon-on-sapphire and silicon-on-insulator devices

Beam properties of the new radiation effects research stations at Indiana University Cyclotron Facility

2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774)
Latest Publications