2012 IEEE AUTOTESTCON Proceedings
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9781467307000, 9781467306980, 9781467306997

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Multi-criteria cartography investigation on diagnostics and prognostics techniques suited for system and vehicle health maintenance

2012 IEEE AUTOTESTCON Proceedings ◽

10.1109/autest.2012.6334531 ◽

2012 ◽

Author(s):

Ioana Geanta ◽

Benoit Iung ◽

Didier Theilliol ◽

Michel Schieber ◽

Yann Fusero

Keyword(s):

Health Maintenance

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Preparing for an IPv6 world with LXI instruments

2012 IEEE AUTOTESTCON Proceedings ◽

10.1109/autest.2012.6334579 ◽

2012 ◽

Author(s):

Tom Fay

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2012 IEEE AUTOTESTCON Proceedings ◽

10.1109/autest.2012.6334590 ◽

2012 ◽

Download Full-text

Data awareness from ATE

2012 IEEE AUTOTESTCON Proceedings ◽

10.1109/autest.2012.6334542 ◽

2012 ◽

Author(s):

Anthony Lowe

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Experimental applications of Automatic Test Markup Language (ATML)

2012 IEEE AUTOTESTCON Proceedings ◽

10.1109/autest.2012.6334532 ◽

2012 ◽

Cited By ~ 1

Author(s):

Chatwin A. Lansdowne ◽

Chris Gorringe ◽

Patrick McCartney

Keyword(s):

Markup Language ◽

Automatic Test

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A new class of test instrument: The FPGA based module

2012 IEEE AUTOTESTCON Proceedings ◽

10.1109/autest.2012.6334533 ◽

2012 ◽

Cited By ~ 1

Author(s):

Patrick B. Kelly

Keyword(s):

New Class ◽

Test Instrument

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Legacy test program sets migration using fault modeling and dynamic reasoning

2012 IEEE AUTOTESTCON Proceedings ◽

10.1109/autest.2012.6334584 ◽

2012 ◽

Author(s):

David R. Carey

Keyword(s):

Fault Modeling ◽

Test Program ◽

Dynamic Reasoning

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Life cycle planning from product development to long term sustainment

2012 IEEE AUTOTESTCON Proceedings ◽

10.1109/autest.2012.6334559 ◽

2012 ◽

Author(s):

Jake Harnack

Keyword(s):

Life Cycle ◽

Product Development

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Testability modeling usage in design-for-test and product lifecycle cost reduction

2012 IEEE AUTOTESTCON Proceedings ◽

10.1109/autest.2012.6334543 ◽

2012 ◽

Author(s):

James Valfre

Keyword(s):

Cost Reduction ◽

Design For Test ◽

Product Lifecycle

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Simplifying test system development with IVI.NET

2012 IEEE AUTOTESTCON Proceedings ◽

10.1109/autest.2012.6334546 ◽

2012 ◽

Cited By ~ 2

Author(s):

Kirk Fertitta

Keyword(s):

System Development ◽

Test System

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2012 IEEE AUTOTESTCON Proceedings
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Multi-criteria cartography investigation on diagnostics and prognostics techniques suited for system and vehicle health maintenance

Preparing for an IPv6 world with LXI instruments

Table of contents

Data awareness from ATE

Experimental applications of Automatic Test Markup Language (ATML)

A new class of test instrument: The FPGA based module

Legacy test program sets migration using fault modeling and dynamic reasoning

Life cycle planning from product development to long term sustainment

Testability modeling usage in design-for-test and product lifecycle cost reduction

Simplifying test system development with IVI.NET

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2012 IEEE AUTOTESTCON ProceedingsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Multi-criteria cartography investigation on diagnostics and prognostics techniques suited for system and vehicle health maintenance

Preparing for an IPv6 world with LXI instruments

Table of contents

Data awareness from ATE

Experimental applications of Automatic Test Markup Language (ATML)

A new class of test instrument: The FPGA based module

Legacy test program sets migration using fault modeling and dynamic reasoning

Life cycle planning from product development to long term sustainment

Testability modeling usage in design-for-test and product lifecycle cost reduction

Simplifying test system development with IVI.NET

2012 IEEE AUTOTESTCON Proceedings
Latest Publications