2017 International Test Conference in Asia (ITC-Asia)
Latest Publications

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Published By IEEE

9781538630518

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Cell-aware test generation time reduction by using switch-level ATPG

2017 International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2017.8097105 ◽

2017 ◽

Author(s):

Po-Yao Chuang ◽

Cheng-Wen Wu ◽

Harry H. Chen

Keyword(s):

Test Generation ◽

Generation Time ◽

Time Reduction

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A quick jitter tolerance estimation technique for bang-bang CDRs

2017 International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2017.8097101 ◽

2017 ◽

Author(s):

Yen-Long Lee ◽

Soon-Jyh Chang

Keyword(s):

Estimation Technique ◽

Jitter Tolerance

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On the effects of real time and contiguous measurement with a digital temperature and voltage sensor

2017 International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2017.8097126 ◽

2017 ◽

Cited By ~ 1

Author(s):

Yousuke Miyake ◽

Yasuo Sato ◽

Seiji Kajihara

Keyword(s):

Real Time ◽

Voltage Sensor

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Physical-aware diagnosis of multiple interconnect defects

2017 International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2017.8097108 ◽

2017 ◽

Cited By ~ 1

Author(s):

Po-Hao Chen ◽

Chi-Lin Lee ◽

Jing-Yu Chen ◽

Po-Wei Chen ◽

James Chien-Mo Li

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Session C3: Memory test

2017 International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2017.8097120 ◽

2017 ◽

Keyword(s):

Memory Test

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Session B3: Test for InFO and SoC

2017 International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2017.8097116 ◽

2017 ◽

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Symbiotic system models for efficient IOT system design and test

2017 International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2017.8097114 ◽

2017 ◽

Cited By ~ 2

Author(s):

Cheng-Wen Wu ◽

Bing-Yang Lin ◽

Hsin-Wei Hung ◽

Shu-Mei Tseng ◽

Chi Chen

Keyword(s):

System Design ◽

Symbiotic System ◽

System Models

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A dependable AMR sensor system for automotive applications

2017 International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2017.8097112 ◽

2017 ◽

Cited By ~ 1

Author(s):

Andreina Zambrano ◽

Hans G. Kerkhoff

Keyword(s):

Sensor System ◽

Automotive Applications

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Test generation for open and delay faults in CMOS circuits

2017 International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2017.8097104 ◽

2017 ◽

Author(s):

Cheng-Hung Wu ◽

Kuen-Jong Lee ◽

Sudhakar M Reddy

Keyword(s):

Test Generation ◽

Cmos Circuits ◽

Delay Faults

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Session C4: Advanced test practices

2017 International Test Conference in Asia (ITC-Asia) ◽

10.1109/itc-asia.2017.8097128 ◽

2017 ◽

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2017 International Test Conference in Asia (ITC-Asia)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Cell-aware test generation time reduction by using switch-level ATPG

A quick jitter tolerance estimation technique for bang-bang CDRs

On the effects of real time and contiguous measurement with a digital temperature and voltage sensor

Physical-aware diagnosis of multiple interconnect defects

Session C3: Memory test

Session B3: Test for InFO and SoC

Symbiotic system models for efficient IOT system design and test

A dependable AMR sensor system for automotive applications

Test generation for open and delay faults in CMOS circuits

Session C4: Advanced test practices

2017 International Test Conference in Asia (ITC-Asia)
Latest Publications