Systematic AUED codes for self-checking architectures

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) ◽

10.1109/dftvs.1998.732165 ◽

2002 ◽

Cited By ~ 1

Author(s):

D. Sciuto ◽

C. Silvano ◽

R. Stefanelli

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