Metrology and Diagnostic Techniques for Nanoelectronics
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Published By CRC Press

9789814745086, 9781351733953

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Methodology and Challenges in Characterization of 3D Package Interconnection Materials and Processes

Metrology and Diagnostic Techniques for Nanoelectronics ◽

10.1201/9781315185385-26 ◽

2016 ◽

pp. 1089-1119

Author(s):

Rajen Dias ◽

Deepak Goyal

Keyword(s):

3D Package

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Electrical Characterization and Reliability Testing Techniques

Metrology and Diagnostic Techniques for Nanoelectronics ◽

10.1201/9781315185385-21 ◽

2016 ◽

pp. 931-931

Keyword(s):

Electrical Characterization ◽

Reliability Testing ◽

Testing Techniques

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Characterization and Metrology for MOS Devices and Interconnects

Metrology and Diagnostic Techniques for Nanoelectronics ◽

10.1201/9781315185385-2 ◽

2016 ◽

pp. 1-1

Keyword(s):

Mos Devices

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Characterization of Magnetic Nanostructures for Spin-Torque Memory Applications with Macro- and Microscale Ferromagnetic Resonance

Metrology and Diagnostic Techniques for Nanoelectronics ◽

10.1201/9781315185385-19 ◽

2016 ◽

pp. 849-889 ◽

Cited By ~ 2

Author(s):

T Silva ◽

H Nembach ◽

J Shaw ◽

Brian Doyle ◽

Kaan Oguz ◽

...

Keyword(s):

Ferromagnetic Resonance ◽

Magnetic Nanostructures ◽

Spin Torque ◽

Memory Applications

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Front matter

Metrology and Diagnostic Techniques for Nanoelectronics ◽

10.1201/9781315185385-1 ◽

2016 ◽

pp. xxix-xli

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3D-AFM Measurements for Semiconductor Structures and Devices

Metrology and Diagnostic Techniques for Nanoelectronics ◽

10.1201/9781315185385-6 ◽

2016 ◽

pp. 109-152 ◽

Cited By ~ 2

Author(s):

Ndubuisi Orji ◽

Ronald Dixson

Keyword(s):

Semiconductor Structures

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Automated Tools and Methods for Debug and Diagnosis

Metrology and Diagnostic Techniques for Nanoelectronics ◽

10.1201/9781315185385-31 ◽

2016 ◽

pp. 1347-1382

Author(s):

Srikanth Venkataraman

Keyword(s):

Automated Tools ◽

Tools And Methods

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Model-Based Scanning Electron Microscopy Critical-Dimension Metrology for 3D Nanostructures

Metrology and Diagnostic Techniques for Nanoelectronics ◽

10.1201/9781315185385-3 ◽

2016 ◽

pp. 3-30

Author(s):

András Vladár

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Critical Dimension ◽

Model Based ◽

3D Nanostructures ◽

Scanning Electron

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Electrical Characterization of Nanoscale Transistors: Emphasis on Traps Associated with MOS Gate Stacks

Metrology and Diagnostic Techniques for Nanoelectronics ◽

10.1201/9781315185385-22 ◽

2016 ◽

pp. 933-976

Author(s):

Xiao Sun ◽

T Ma

Keyword(s):

Electrical Characterization ◽

Gate Stacks ◽

Nanoscale Transistors ◽

Mos Gate

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Characterization Techniques for Novel Materials and Devices beyond CMOS

Metrology and Diagnostic Techniques for Nanoelectronics ◽

10.1201/9781315185385-17 ◽

2016 ◽

pp. 757-757

Keyword(s):

Novel Materials ◽

Characterization Techniques ◽

Beyond Cmos

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Metrology and Diagnostic Techniques for NanoelectronicsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By CRC Press

Methodology and Challenges in Characterization of 3D Package Interconnection Materials and Processes

Electrical Characterization and Reliability Testing Techniques

Characterization and Metrology for MOS Devices and Interconnects

Characterization of Magnetic Nanostructures for Spin-Torque Memory Applications with Macro- and Microscale Ferromagnetic Resonance

Front matter

3D-AFM Measurements for Semiconductor Structures and Devices

Automated Tools and Methods for Debug and Diagnosis

Model-Based Scanning Electron Microscopy Critical-Dimension Metrology for 3D Nanostructures

Electrical Characterization of Nanoscale Transistors: Emphasis on Traps Associated with MOS Gate Stacks

Characterization Techniques for Novel Materials and Devices beyond CMOS

Metrology and Diagnostic Techniques for Nanoelectronics
Latest Publications