Structural Properties of 300 Å of Iron Films Grown on Polycrystalline Substrate

In this manuscript, the structural properties such as the distance inter-reticular of samples is studied, In the fact, four samples were used symbolized as follows: E tAg(Å), the only difference is the thickness of the Silver buffer layer (tAg= 0, 50, 100 and 150 Å) to find out how the thickness of this layer depends on the structural characteristics of the Iron thin layer, all samples are deposited using molecular beam epitaxy (MBE) at room temperature onto Si (100) substrate. The structural properties of all samples examined using X-ray diffraction method at small and high angles. The small angles X-Ray diffraction curves confirmed to us that there is a clear difference between the surface structure of the samples by varying the number of Kiessig Fringes, Also high angles X-Ray diffraction curves assured us this difference through the clear variation in the angular positions of the peaks of Bragg and the distances inter-reticular values from a sample to the other.