lattice boundary
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2017 ◽  
Vol 907 ◽  
pp. 173-179
Author(s):  
Maria Zorina ◽  
Stepan Stepanov ◽  
Maxim Karabanalov ◽  
Mikhail Lobanov

Using electron backscatter diffraction (EBSD), the relationship between deformation textures, developed upon different stress-strain states and characterized by the basic crystallographic orientations of recrystallized grains, has been studied in a FCC metal. The regularities of recrystallization twins development were considered. Crystallo-geometric relations between the deformation and the recrystallization orientations were explained with the mobility of the special grain boundary close to the coinciding site lattice boundary Σ25b. Mechanisms of nucleation and growth of the annealing twins were proposed.


2014 ◽  
Vol 86 ◽  
pp. 80-87 ◽  
Author(s):  
C.R. Das ◽  
S.K. Albert ◽  
K. Laha ◽  
J. Swaminathan ◽  
S. Ravi ◽  
...  

2012 ◽  
Vol 45 (4) ◽  
pp. 719-725 ◽  
Author(s):  
H. W. Jeong ◽  
I. S. Kim ◽  
S. M. Seo ◽  
Y. S. Yoo ◽  
B. G. Choi ◽  
...  

Face-centred cubic Cr-rich carbide is known to precipitate in a face-centred cubic matrix with a cube–cube orientation relationship, thereby minimizing the elastic strain energy. In the present study, for the first time, the precipitation was observed of an abnormal Cr-rich carbide, which did not have the cube–cube orientation relationship in its face-centred cubic matrix. The abnormally oriented carbides nucleated and grew around random grain boundaries, and were observed to have a lamellar or plate-like morphology. The crystallographic orientation anomaly was characterized by measuring the tilt angles of the three crystal poles of the matrices, carbides and adjacent grains, using a transmission electron microscope to find the closest coincidence site lattice boundary. The carbides showed a slight deviation from a cube–cube orientation with adjacent grains and did not present any particular orientational relationship with the matrix. The deviation angles from coincidence site lattice boundaries between the matrices and carbides were smaller than those between matrices and adjacent grains. The abnormally oriented carbides appeared to nucleate on adjacent grains, and underwent a rotation within the matrix during the initial stage of growth to release the phase boundary energy between the carbides and the matrix.


2008 ◽  
Vol 75 (2) ◽  
Author(s):  
A. Srikantha Phani ◽  
Norman A. Fleck

The phenomenon of elastic boundary layers under quasistatic loading is investigated using the Floquet–Bloch formalism for two-dimensional, isotropic, periodic lattices. The elastic boundary layer is a region of localized elastic deformation, confined to the free edge of a lattice. Boundary layer phenomena in three isotropic lattice topologies are investigated: the semiregular Kagome lattice, the regular hexagonal lattice, and the regular fully triangulated lattice. The boundary layer depth is on the order of the strut length for the hexagonal and the fully triangulated lattices. For the Kagome lattice, the depth of boundary layer scales inversely with the relative density. Thus, the boundary layer in a Kagome lattice of low relative density spans many cells.


2007 ◽  
Vol 1025 ◽  
Author(s):  
Nobuyuki Matsuki ◽  
R. Ishihara ◽  
A. Baiano ◽  
Y. Hiroshima ◽  
S. Inoue ◽  
...  

AbstractLocal electrical property of coincidence site lattice boundaries (CSLBs) in location-controlled silicon islands, which are fabricated using micro-Czochralski process (grain filter), was characterized by scanning spreading resistance microscopy (SSRM) and scanning spreading resistance microscopy (SCM). Some CSLBs found in a silicon island are analyzed as Sigma 3 and Sigma 9 by electron back scattering diffraction pattern. These CSLBs are determined as {111}Sigma 3 and {221}Sigma 9 by referring to previous observation results made by transmission electron microscopy. {111}Sigma3 CSLBs shows no activity for SCM or SSRM; this is consistent with previous prediction that {111}Sigma 3 CSLB is not electrical active. We verified a capability of SCM and SSRM for characterizing local electrical property of coincidence site lattice boundary in silicon.


Author(s):  
A. Srikantha Phani ◽  
Norman A. Fleck

The phenomenon of elastic boundary layers under quasistatic loading is investigated using the Floquet-Bloch formalism for two-dimensional, isotropic, periodic lattices. The elastic boundary layer is a region of localised elastic deformation, confined to the free-edge of a lattice. Boundary layer phenomena in three isotropic lattice topologies are investigated: the semi-regular Kagome lattice, the regular hexagonal lattice and the regular fully-triangulated lattice. The boundary layer depth is on the order of the strut length for the hexagonal and the fully-triangulated lattices. For the Kagome lattice, the depth of boundary layer scales inversely with the relative density. Thus, the boundary layer in a Kagome lattice of low relative density spans many cells.


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