Test Procedures for Synchronized Oscillators Network CMOS VLSI Chip

The paper presents test procedures designed for application-specific integrated circuit (ASIC) CMOS VLSI chip prototype that implements a synchronized oscillator neural network with a matrix size of 32×32 for object detecting in binary images. Networks of synchronized oscillators are recently developed tool for image segmentation and analysis. This paper briefly introduces synchronized oscillators network. Basic chip analog building blocks with their test procedures and measurements results are presented. In order to do measurements, special basic building blocks test structures have been implemented in the chip. It let compare Spectre simulations results to measurements results. Moreover, basic chip analog building blocks measurements give precious information about their imperfections caused by MOS transistor mismatch. This information is very usable during design and improvement of a special setup for chip functional tests. Improvement of the setup is a digitally assisted analog technique. It is an original idea of oscillators tuning procedure used during chip prototype testing. Such setup, oscillators tuning procedure and segmentation of sample binary images are presented

NOVEL FCS-BASED LAYOUT-FRIENDLY ACCURATE WIDE-BAND LOW-POWER CCII- REALIZATIONS

This paper presents two novel Floating Current Source (FCS)-based CMOS negative second generation current conveyor (CCII-) realizations suitable for very large scale implementation. The proposed realizations provide high voltage and current tracking accuracy, as well as large voltage and current transfer bandwidths. Simulation results show that the first proposed wide-band CCII- bandwidth is about 972 MHz. Targeting low-power dissipation, a second low-power version of the wide-band CCII- is proposed at the expense of lower bandwidth and accuracy. The proposed CCII- realizations are layout-friendly because they can be easily fabricated in a systematic modular layout fashion. In addition, a fair comparison is held between the proposed realizations and the only FCS-based CCII- realizations in the literature to show the strength of the proposed circuits. The proposed two CCII- realizations show excellent immunity to process variations and transistor mismatch. In addition, they are insensitive to the temperature variations. Finally, two common CCII- applications are presented.