Modeling and Analysis of Transistor Mismatch Due to Variability in Short-Channel Effect Induced by Random Dopant Fluctuation
2012 ◽
Vol 33
(8)
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pp. 1099-1101
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2015 ◽
Vol 36
(7)
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pp. 648-650
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2001 ◽
Vol 48
(6)
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pp. 1114-1120
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2011 ◽
Vol 59
(3)
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pp. 2368-2371
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Keyword(s):
2016 ◽
Vol 82
◽
pp. 31-34
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Keyword(s):