The Effect of Adding Sodium Carbonate on the Electrical Conductivity of Aluminum Paste

Base metal pastes have been widely used in the preparation of ZnO varistor electrodes, and it is important to accurately grasp the relevant mechanisms affecting the conductivity of aluminum electrodes. In this paper, the effect of adding sodium carbonate on the conductive property of aluminum paste was assessed, and the microscopic mechanism during aluminum electrode sintering explored. The results show that adding sodium carbonate can reduce the softening point of glass powder and enhance its fluidity. Sodium carbonate, glass, and aluminum oxide film react together; consequently, the aluminum oxide film is partially dissolved by reaction to produce defects, and there is tight contact at the interface between the aluminum powder particles. The sodium ions will displace the aluminum ions in the alumina, conferring the alumina film with a certain ionic conductivity. At the same time, sodium ions are doped into the aluminum lattice, which causes the aluminum lattice to swell. After sintering, the structure of aluminum electrode is compact and its electrical conductivity is significantly improved. This study is a valuable reference for the theoretical research and the potential applications of aluminum paste.

Peculiar Porous Aluminum Oxide Films Produced viaElectrochemical Anodizing in Malonic Acid Solution withArsenazo-I Additive

The influence of arsenazo-I additive on electrochemical anodizing of pure aluminum foil in malonic acid was studied. Aluminum dissolution increased with increasing arsenazo-I concentration. The addition of arsenazo-I also led to an increase in the volume expansion factor up to 2.3 due to the incorporation of organic compounds and an increased number of hydroxyl groups in the porous aluminum oxide film. At a current density of 15 mA·cm–2 and an arsenazo-I concentration 3.5 g·L–1, the carbon content in the anodic alumina of 49 at. % was achieved. An increase in the current density and concentration of arsenazo-I caused the formation of an arsenic-containing compound with the formula Na1,5Al2(OH)4,5(AsO4)3·7H2O in the porous aluminum oxide film phase. These film modifications cause a higher number of defects and, thus, increase the ionic conductivity, leading to a reduced electric field in galvanostatic anodizing tests. A self-adjusting growth mechanism, which leads to a higher degree of self-ordering in the arsenazo-free electrolyte, is not operative under the same conditions when arsenazo-I is added. Instead, a dielectric breakdown mechanism was observed, which caused the disordered porous aluminum oxide film structure.