high growth temperature
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CrystEngComm ◽  
2018 ◽  
Vol 20 (9) ◽  
pp. 1185-1188 ◽  
Author(s):  
Ji-Wei Shen ◽  
Zhiqing Wang ◽  
Xiaoxuan Wei ◽  
Jiawei Liu ◽  
Yinmao Wei

A facile ex situ NaF size/morphology tuning strategy for NaF release rate regulation was presented and successfully used to achieve time-saving controlled solvothermal synthesis of highly monodisperse/crystalline sub-5 nm β-NaGdF4:Yb/Er at a high growth temperature of 300 °C.


2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Jun Chen ◽  
Jing Shen ◽  
Lars Ingvar Hellgren ◽  
Peter Ruhdal Jensen ◽  
Christian Solem

2015 ◽  
Vol 50 (12) ◽  
pp. 4366-4370 ◽  
Author(s):  
Takahiro Tsukamoto ◽  
Nobumitsu Hirose ◽  
Akifumi Kasamatsu ◽  
Takashi Mimura ◽  
Toshiaki Matsui ◽  
...  

2014 ◽  
Vol 123 ◽  
pp. 166-170 ◽  
Author(s):  
P.M.P. Salomé ◽  
A. Hultqvist ◽  
V. Fjällström ◽  
B. Vermang ◽  
M. Edoff ◽  
...  

2013 ◽  
Vol 740-742 ◽  
pp. 793-796 ◽  
Author(s):  
K. Kojima ◽  
A. Nagata ◽  
S. Ito ◽  
Y. Sakuma ◽  
R. Kosugi ◽  
...  

We performed deep trench filling by using epitaxial SiC growth. It was found that the trench filling condition depend on trench width. A high growth temperature was needed to fill a narrow trench and a low growth temperature was needed to fill a wide trench structure. We optimized the filling condition and successfully filled 7μ m deep and 2 μm wide trench without void formation. We also investigated the 2D doping distribution of the filled area by SSRM. As a result, it is found that the existence of a sub-trench was related to the generation of a doping distribution in the filled area. The trench filling mechanism and doping distribution are discussed.


2012 ◽  
Vol 717-720 ◽  
pp. 625-628 ◽  
Author(s):  
Adrien Michon ◽  
Elodie Roudon ◽  
Marc Portail ◽  
Benoit Jouault ◽  
Sylvie Contreras ◽  
...  

We have grown graphene on SiC(0001) using propane-hydrogen CVD. In this work, we present the effects of growth pressure and temperature on structural and electrical properties. Structural characterizations evidence the formation of graphene with in-plane rotational disorder, except for low growth pressure and high growth temperature which lead to the formation of a (6Ö3´6Ö3)-30° interface between graphene and SiC. Electrical properties of samples presenting different graphene/SiC stacking and interfaces are compared and discussed.


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