copper indium disulphide
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Hierarchical architecture of CuInS2 microsphere thin films: altering laterally aligned crystallographic plane growth by Cd and V doping

CrystEngComm ◽  
2017 ◽  
Vol 19 (44) ◽  
pp. 6602-6611 ◽  
Author(s):  
Logu Thirumalaisamy ◽  
Ramesh Raliya ◽  
Shalinee Kavadiya ◽  
Soundarrajan Palanivel ◽  
Kunjithapatham Sethuraman ◽  
...  
Keyword(s):  
Thin Films ◽  
Crystallographic Plane ◽  
Hierarchical Architecture ◽  
Copper Indium ◽  
Self Assembled ◽  
Copper Indium Disulphide

Nano-flakes of self-assembled porous pristine and cadmium (Cd) and vanadium (V) doped copper indium disulphide (CuInS2 (CIS)) microspheres are synthesized.

Fabrication of high quality copper indium disulphide absorbers by bell-like wave modulated electrodeposition

2016 ◽  
Vol 76 ◽  
pp. 85-93 ◽  
Author(s):  
Ke Cheng ◽  
Xiaoyun Wang ◽  
Jingjing Liu ◽  
Yuqian Huang ◽  
Ming Xue ◽  
...  
Keyword(s):  
High Quality ◽  
Copper Indium ◽  
Copper Indium Disulphide

Photochemically deposited and post annealed copper indium disulphide thin films

2014 ◽  
Vol 75 ◽  
pp. 667-679 ◽  
Author(s):  
R. Suriakarthick ◽  
V. Nirmal Kumar ◽  
R. Indirajith ◽  
T.S. Shyju ◽  
R. Gopalakrishnan
Keyword(s):  
Thin Films ◽  
Copper Indium ◽  
Copper Indium Disulphide ◽  
Annealed Copper

Optical absorbance enhancement by electrochemical surface roughening of CuInS2 thin films

2009 ◽  
Vol 24 (10) ◽  
pp. 3044-3049 ◽  
Author(s):  
Romain Cayzac ◽  
Florence Boulc'h ◽  
Virginie Hornebecq ◽  
Thierry Djenizian ◽  
Marc Bendahan ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrochemical Etching ◽  
Surface Roughening ◽  
X Ray Diffraction ◽  
Optical Absorbance ◽  
Force Microscopy ◽  
Atomic Force ◽  
Copper Indium ◽  
Cuins2 Thin Films ◽  
Copper Indium Disulphide

This work presents a simple electrochemical etching method to increase the surface roughness of copper indium disulphide (CIS) thin films using low concentration of hydrochloric acid. Film morphologies were investigated using scanning electron microscopy and atomic force microscopy. The structure of films was investigated using x-ray diffraction. A comparative study of optical properties of as-deposited and roughened CIS thin films by transmittance and reflectance experiments show a strong enhancement of absorbance for wavelengths between 600 and 900 nm.

Heat-treatment effect of chalcopyrite copper indium disulphide thin film growth

1995 ◽  
Vol 71 (1-3) ◽  
pp. 1747-1748 ◽  
Author(s):  
S.K. Kim ◽  
W.J. Jeong ◽  
G.C. Park ◽  
Y.G. Back ◽  
Y.G. Jeong ◽  
...  
Keyword(s):  
Thin Film ◽  
Heat Treatment ◽  
Treatment Effect ◽  
Film Growth ◽  
Thin Film Growth ◽  
Copper Indium ◽  
Copper Indium Disulphide

Preparation of copper indium disulphide films by airless spraying

1988 ◽  
Vol 167 (1-2) ◽  
pp. 217-222 ◽  
Author(s):  
S. Belgacem ◽  
M. Dachraoui ◽  
J. Kessler ◽  
J. Vedel
Keyword(s):  
Copper Indium ◽  
Copper Indium Disulphide

X-ray studies on the thermal expansion of copper indium disulphide

Pramana ◽  
1981 ◽  
Vol 16 (4) ◽  
pp. 281-286 ◽  
Author(s):  
P Kistaiah ◽  
Y C Venudhar ◽  
K Sathyanarayana Murthy ◽  
Leela Iyengar ◽  
K V Krishna Rao
Keyword(s):  
Thermal Expansion ◽  
X Ray ◽  
Copper Indium ◽  
Copper Indium Disulphide
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