fpga testing
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Author(s):  
Guochang Zhou ◽  
Xiang Gao ◽  
Xiaoling Lai ◽  
Qi Zhu ◽  
Ting Ju ◽  
...  

Author(s):  
Robert Hulle ◽  
Petr Fiser ◽  
Jan Schmidt ◽  
Jaroslav Borecky
Keyword(s):  

2014 ◽  
Vol 14 (2) ◽  
pp. 57-62
Author(s):  
O. BREKHOV ◽  
M. RATNIKOV
Keyword(s):  

Author(s):  
О.М. Брехов ◽  
◽  
М.О. Ратников ◽  
Keyword(s):  

2003 ◽  
Vol 12 (02) ◽  
pp. 143-158 ◽  
Author(s):  
M. Renovell

This paper presents a structural approach for testing SRAM-based FPGAs taking into account the configurability of such flexible devices. When SRAM-based FPGA testing is considered, different situations have first to be identified: namely the Application-Oriented Test situation and the Manufacturing-Oriented Test situation. This paper concentrates on Test Pattern Generation and DFT for an Application-Oriented test of SRAM-based FPGAs.


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