SAT-ATPG for application-oriented FPGA testing

2016 ◽  
Author(s):  
Robert Hulle ◽  
Petr Fiser ◽  
Jan Schmidt ◽  
Jaroslav Borecky
Keyword(s):  
Fpga Testing

scholarly journals FPGA testing using pipelined error-detecting codes

2013 ◽  
Author(s):  
О.М. Брехов ◽  
◽  
М.О. Ратников ◽  
Keyword(s):  
Error Detecting ◽  
Fpga Testing

scholarly journals Pipelined Error-detecting Codes in FPGA Testing

2014 ◽  
Vol 14 (2) ◽  
pp. 57-62
Author(s):  
O. BREKHOV ◽  
M. RATNIKOV
Keyword(s):  
Error Detecting ◽  
Fpga Testing

FPGA testing points optimization method based on important analysis

2016 ◽  
Author(s):  
Guochang Zhou ◽  
Xiang Gao ◽  
Xiaoling Lai ◽  
Qi Zhu ◽  
Ting Ju ◽  
...  
Keyword(s):  
Optimization Method ◽  
Fpga Testing

Some Aspects of the Test Generation Problem for an Application-Oriented Test of SRAM-Based FPGAs

2003 ◽  
Vol 12 (02) ◽  
pp. 143-158 ◽  
Author(s):  
M. Renovell
Keyword(s):  
Test Generation ◽  
Test Pattern ◽  
Pattern Generation ◽  
Structural Approach ◽  
Test Pattern Generation ◽  
Test Situation ◽  
Flexible Devices ◽  
Generation Problem ◽  
Fpga Testing

This paper presents a structural approach for testing SRAM-based FPGAs taking into account the configurability of such flexible devices. When SRAM-based FPGA testing is considered, different situations have first to be identified: namely the Application-Oriented Test situation and the Manufacturing-Oriented Test situation. This paper concentrates on Test Pattern Generation and DFT for an Application-Oriented test of SRAM-based FPGAs.

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