Quantitative material analysis using secondary electron energy spectromicroscopy

This paper demonstrates how secondary electron energy spectroscopy (SEES) performed inside a scanning electron microscope (SEM) can be used to map sample atomic number and acquire bulk valence band density of states (DOS) information at low primary beam voltages. The technique uses an electron energy analyser attachment to detect small changes in the shape of the scattered secondary electron (SE) spectrum and extract out fine structure features from it. Close agreement between experimental and theoretical bulk valance band DOS distributions was obtained for six different test samples, where the normalised root mean square deviation ranged from 2.7 to 6.7%. High accuracy levels of this kind do not appear to have been reported before. The results presented in this paper point towards SEES becoming a quantitative material analysis companion tool for low voltage scanning electron microscopy (LVSEM) and providing new applications for Scanning Auger Microscopy (SAM) instruments.

Scanning Auger Microscopy Studies of Silane Films Grown on Plasma-Modified HOPG Surfaces

The growth of silane films on plasma oxidized highly oriented pyrolytic graphite (HOPG) surfaces has been studied using wet chemical deposition of propyltrimethoxysilane (PTMS) and propyldimethylmethoxysilane (PDMMS). Scanning Auger microscopy (SAM) and X-ray photoelectron spectroscopy (XPS) were used to investigate the chemical composition and morphology of the silane films. The effects of several deposition parameters were examined, including the necessity of oxidation of the HOPG surface, addition of water with the silane, and rinsing before curing. The optimal conditions needed to create a complete uniform film differ for the two silanes due to differences in their structures. Both silanes require an oxidized HOPG surface for a film to grow, the addition of water with PTMS results in a thicker film, while the addition of water with PDMMS decreases the film growth. Rinsing of both samples before curing removes physisorbed species, leaving only the covalently bonded film on the surface.

New insights into the characterization of the electrode/electrolyte interfaces within LiMn2O4/Li4Ti5O12 cells, by X-ray photoelectron spectroscopy, scanning Auger microscopy and time-of-flight secondary ion mass spectrometry

This work aims to study the electrode/electrolyte interfaces in a Li4Ti5O12 (LTO)/LiMn2O4 (LMO) cell assembled with a VC-containing electrolyte and operating at 60 °C.