New insights into the characterization of the electrode/electrolyte interfaces within LiMn2O4/Li4Ti5O12 cells, by X-ray photoelectron spectroscopy, scanning Auger microscopy and time-of-flight secondary ion mass spectrometry

2017 ◽  
Vol 5 (29) ◽  
pp. 15315-15325 ◽  
Author(s):  
Jean-Baptiste Gieu ◽  
Volker Winkler ◽  
Cécile Courrèges ◽  
Loubna El Ouatani ◽  
Cécile Tessier ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
X Ray ◽  
Scanning Auger Microscopy ◽  
Ion Mass Spectrometry ◽  
Auger Microscopy ◽  
Secondary Ion

This work aims to study the electrode/electrolyte interfaces in a Li4Ti5O12 (LTO)/LiMn2O4 (LMO) cell assembled with a VC-containing electrolyte and operating at 60 °C.

Static time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films

2001 ◽  
Vol 31 (8) ◽  
pp. 724-733 ◽  
Author(s):  
Caren D. Tidwell ◽  
David G. Castner ◽  
Stephen L. Golledge ◽  
Buddy D. Ratner ◽  
Klaus Meyer ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Characterization of hydrogenated graphite powder by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

RSC Advances ◽  
2016 ◽  
Vol 6 (84) ◽  
pp. 80649-80654 ◽  
Author(s):  
Wenjing Xie ◽  
Kai Mo Ng ◽  
Lu-Tao Weng ◽  
Chi-Ming Chan
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Graphite Powder ◽  
X Ray ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Hydrogenated graphite powder was obtained through Birch reduction of graphite powder and characterized by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) at 500 °C.

Characterization of Composition C4 Explosives using Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy

2010 ◽  
Vol 82 (17) ◽  
pp. 7237-7248 ◽  
Author(s):  
Christine M. Mahoney ◽  
Albert J. Fahey ◽  
Kristen L. Steffens ◽  
Bruce A. Benner ◽  
Richard T. Lareau
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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