Novel current collapse mode induced by source leakage current in AlGaN/GaN high-electron-mobility transistors and its impact
2013 ◽
Vol 53
(9-11)
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pp. 1456-1460
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2019 ◽
Vol 100-101
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pp. 113432
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2011 ◽
Vol 50
(6)
◽
pp. 061001
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2010 ◽
Vol 54
(11)
◽
pp. 1430-1433
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