Simultaneous measurement of cloud microphysical parameters based on digital holographic interferometry

doi:10.7498/aps.70.20201779

Simultaneous measurement of cloud microphysical parameters based on digital holographic interferometry

Acta Physica Sinica ◽

10.7498/aps.70.20201779 ◽

2021 ◽

Vol 0 (0) ◽

pp. 0-0

Author(s):

Keyword(s):

Holographic Interferometry ◽

Simultaneous Measurement ◽

Microphysical Parameters

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Simultaneous measurement of displacement, strain and curvature in digital holographic interferometry using high-order instantaneous moments

Optics Express ◽

10.1364/oe.17.017784 ◽

2009 ◽

Vol 17 (20) ◽

pp. 17784 ◽

Cited By ~ 16

Author(s):

Sai Siva Gorthi ◽

Pramod Rastogi

Keyword(s):

Holographic Interferometry ◽

Simultaneous Measurement ◽

High Order

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Simultaneous measurement of stress-optic constant and stress field of transparent plate by digital holographic interferometry

Optik ◽

10.1016/j.ijleo.2016.09.104 ◽

2016 ◽

Vol 127 (24) ◽

pp. 11974-11981 ◽

Cited By ~ 3

Author(s):

Haiting Xia ◽

Rongxin Guo ◽

Feng Yan ◽

Heming Cheng ◽

Zhiwei Lin ◽

...

Keyword(s):

Stress Field ◽

Holographic Interferometry ◽

Simultaneous Measurement ◽

Transparent Plate

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Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry

Optics & Laser Technology ◽

10.1016/j.optlastec.2013.08.019 ◽

2014 ◽

Vol 56 ◽

pp. 241-246 ◽

Cited By ~ 2

Author(s):

J. Li ◽

Y.R. Wang ◽

X.F. Meng ◽

X.L. Yang ◽

Q.P. Wang

Keyword(s):

Holographic Interferometry ◽

Simultaneous Measurement ◽

Phase Shifting ◽

Dual Wavelength ◽

Thickness Variation ◽

Optical Inhomogeneity

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Simultaneous Measurement of Out-of-Plane and In-Plane Displacements by Phase-Shifting Digital Holographic Interferometry

Applied Mechanics and Materials ◽

10.4028/www.scientific.net/amm.3-4.223 ◽

2006 ◽

Vol 3-4 ◽

pp. 223-228 ◽

Cited By ~ 7

Author(s):

S. Okazawa ◽

Motoharu Fujigaki ◽

Yoshiharu Morimoto ◽

Toru Matui

Keyword(s):

Phase Difference ◽

Holographic Interferometry ◽

Simultaneous Measurement ◽

Phase Distribution ◽

Complex Amplitude ◽

Phase Shifting ◽

Two Phase ◽

Displacement Distribution ◽

Before And After ◽

Out Of Plane

In this paper, we apply phase-shifting digital holographic interferometry to simultaneous measurement for out-of-plane and in-plane displacements by employing two beam illuminations for an object. Phase-shifted holograms before and after displacements of the object using each of two beams are recorded by a CCD camera, separately. The complex amplitude at each pixel of the CCD plane is analyzed from the holograms taken with phase-shifting. The complex amplitude of he object is reconstructed from the complex amplitude distribution on the CCD plane using the Fresnel diffraction integral. Each directional phase difference distribution is obtained by calculating the phases before and after deformation for each directional beam. The phase distribution for out-of-plane displacements is obtained by calculating the sum of the two phase difference distributions. The phase distribution for in-plane displacements is obtained by calculating the difference of the two phase difference distributions. The phase values provide accurate displacement distribution information. Actually, when the object deforms in both out-of-plane and in-plane directions, it is possible to analyze the displacement distribution in each direction. The theory and an experiment are shown.

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