scholarly journals Molecular beam epitaxy growth of multilayer FeSe thin film on SrTiO3 (001)

2016 ◽  
Vol 65 (12) ◽  
pp. 127401
Author(s):  
Zhang Ma-Lin ◽  
Ge Jian-Feng ◽  
Duan Ming-Chao ◽  
Yao Gang ◽  
Liu Zhi-Long ◽  
...  
2020 ◽  
Vol 10 (2) ◽  
pp. 272-277
Author(s):  
Niraj Bhattarai ◽  
Andrew W. Forbes ◽  
Rajendra P. Dulal ◽  
Ian L. Pegg ◽  
John Philip


2017 ◽  
Vol 33 (2) ◽  
pp. 419-425
Author(s):  
Hai-Fei WU ◽  
◽  
Yao CHEN ◽  
Shan-Hu XU ◽  
Yong-Hong YAN ◽  
...  

Author(s):  
M. E. Twigg ◽  
E. D. Richmond ◽  
J. G. Pellegrino

For heteroepitaxial systems, such as silicon on sapphire (SOS), microtwins occur in significant numbers and are thought to contribute to strain relief in the silicon thin film. The size of this contribution can be assessed from TEM measurements, of the differential volume fraction of microtwins, dV/dν (the derivative of the microtwin volume V with respect to the film volume ν), for SOS grown by both chemical vapor deposition (CVD) and molecular beam epitaxy (MBE).In a (001) silicon thin film subjected to compressive stress along the [100] axis , this stress can be relieved by four twinning systems: a/6[211]/( lll), a/6(21l]/(l1l), a/6[21l] /( l1l), and a/6(2ll)/(1ll).3 For the a/6[211]/(1ll) system, the glide of a single a/6[2ll] twinning partial dislocation draws the two halves of the crystal, separated by the microtwin, closer together by a/3.


1988 ◽  
Vol 64 (7) ◽  
pp. 3522-3527 ◽  
Author(s):  
Mitsuru Ohtsuka ◽  
Seiichi Miyazawa

2014 ◽  
Vol 390 ◽  
pp. 120-124 ◽  
Author(s):  
Robert D. Richards ◽  
Faebian Bastiman ◽  
Christopher J. Hunter ◽  
Danuta F. Mendes ◽  
Abdul R. Mohmad ◽  
...  

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