Influence of pit defects on AlGaN surface and dislocation defects in GaN buffer layer on current collapse of AlGaN/GaN HEMTs
2017 ◽
Vol 215
(2)
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pp. 1700368
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2015 ◽
Vol 212
(8)
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pp. 1742-1745
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2010 ◽
Vol 53
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pp. 1578-1581
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2016 ◽
Vol 13
(5-6)
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pp. 341-344
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2018 ◽
Vol 18
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pp. 46-53
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2019 ◽
Vol 215
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pp. 110985
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