scholarly journals Study of optical constants in Se- In Pb thin films of chalcogenide glasses

2014 ◽  
Vol 9 (1) ◽  
pp. 1-6
Author(s):  
Dwivedi Preeti ◽  
Awasthi Rita
Keyword(s):  
Thin Films ◽  
Chalcogenide Glasses ◽  
Optical Constants

scholarly journals Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices

2013 ◽  
Vol 2013 ◽  
pp. 1-11 ◽  
Author(s):  
R. Todorov ◽  
J. Tasseva ◽  
V. Lozanova ◽  
A. Lalova ◽  
Tz. Iliev ◽  
...  
Keyword(s):  
Thin Films ◽  
Chalcogenide Glasses ◽  
Optical Constants ◽  
Thermal Evaporation ◽  
Optical Devices ◽  
Point Of View ◽  
Angle Of Incidence ◽  
Optical Elements ◽  
Ellipsometric Characterization

A review is given on the application of the reflectance ellipsometry for optical characterization of bulk materials and thin films with thickness betweenλ/20 and 2λ(atλ=632.8 nm). The knowledge of the optical constants (refractive index,n, and extinction coefficient,k) of thin films is of a great importance from the point of view of modelling and controlling the manufacture of various optical elements, such as waveguides, diffraction gratings, and microlenses. The presented results concern the optical properties of thin films from multicomponent chalcogenide glasses on the base of As2S3and GeS2determined by multiple-angle-of-incidence ellipsometry and regarded as a function of the composition and thickness. The homogeneity of the films is verified by applying single-angle calculations at different angles. Due to decomposition of the bulk glass during thermal evaporation, an optical inhomogeneity of the thin As (Ge)-S-Bi(Tl) films is observed. The profile ofnin depth of thin As-S-Tl (Bi) films was investigated by evaporation of discrete layers. It is demonstrated that homogenous layers from the previous compounds with controlled composition can be deposited by coevaporation of As2S3and metals or their compounds (Bi, Tl, In2S3).

scholarly journals Introduction of Chalcogenide Glasses to Additive Manufacturing: Nanoparticle Ink Formulation, Inkjet Printing, and Phase Change Devices Fabrication

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
A. Ahmed Simon ◽  
B. Badamchi ◽  
H. Subbaraman ◽  
Y. Sakaguchi ◽  
L. Jones ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Change ◽  
Inkjet Printing ◽  
Chalcogenide Glasses ◽  
Dip Coating ◽  
Potential Applications ◽  
Coating Methods ◽  
Report Data ◽  
Nanoparticle Ink ◽  
Ink Formulation

AbstractChalcogenide glasses are one of the most versatile materials that have been widely researched because of their flexible optical, chemical, electronic, and phase change properties. Their application is usually in the form of thin films, which work as active layers in sensors and memory devices. In this work, we investigate the formulation of nanoparticle ink of Ge–Se chalcogenide glasses and its potential applications. The process steps reported in this work describe nanoparticle ink formulation from chalcogenide glasses, its application via inkjet printing and dip-coating methods and sintering to manufacture phase change devices. We report data regarding nanoparticle production by ball milling and ultrasonication along with the essential characteristics of the formed inks, like contact angle and viscosity. The printed chalcogenide glass films were characterized by Raman spectroscopy, X-ray diffraction, energy dispersive spectroscopy and atomic force microscopy. The printed films exhibited similar compositional, structural, electronic and optical properties as the thermally evaporated thin films. The crystallization processes of the printed films are discussed compared to those obtained by vacuum thermal deposition. We demonstrate the formation of printed thin films using nanoparticle inks, low-temperature sintering and proof for the first time, their application in electronic and photonic temperature sensors utilizing their phase change property. This work adds chalcogenide glasses to the list of inkjet printable materials, thus offering an easy way to form arbitrary device structures for optical and electronic applications.

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films

Optical constants of Sn-doped amorphous Ge-As-Te thin films and their physical characterization

2020 ◽  
Vol 583 ◽  
pp. 412066 ◽  
Author(s):  
Imed Boukhris ◽  
Imen Kebaili ◽  
Sami Znaidia ◽  
R. Neffati ◽  
H.H. Hegazy ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Physical Characterization

New Focusing Reflectometer for Measuring Optical Constants of Thin Films

1971 ◽  
Vol 10 (2) ◽  
pp. 342 ◽  
Author(s):  
R. E. Burge ◽  
A. T. Davidson ◽  
J. C. Draper ◽  
G. R. Field ◽  
E. Murphy
Keyword(s):  
Thin Films ◽  
Optical Constants

Effect of Sn substitution for Se on dispersive optical constants of amorphous Se–Te–Sn thin films

2017 ◽  
pp. 1-9 ◽  
Author(s):  
M. A. Dabban ◽  
Nema M. Abdelazim ◽  
Alaa M. Abd-Elnaiem ◽  
S. Mustafa ◽  
M. A. Abdel-Rahim
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Sn Substitution

Optical constants measurement of single-layer thin films on transparent substrates

1998 ◽  
Vol 158 (1-6) ◽  
pp. 221-230 ◽  
Author(s):  
A. Penzkofer ◽  
E. Drotleff ◽  
W. Holzer
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Single Layer
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