scholarly journals Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices

2013 ◽  
Vol 2013 ◽  
pp. 1-11 ◽  
Author(s):  
R. Todorov ◽  
J. Tasseva ◽  
V. Lozanova ◽  
A. Lalova ◽  
Tz. Iliev ◽  
...  
Keyword(s):  
Thin Films ◽  
Chalcogenide Glasses ◽  
Optical Constants ◽  
Thermal Evaporation ◽  
Optical Devices ◽  
Point Of View ◽  
Angle Of Incidence ◽  
Optical Elements ◽  
Ellipsometric Characterization

A review is given on the application of the reflectance ellipsometry for optical characterization of bulk materials and thin films with thickness betweenλ/20 and 2λ(atλ=632.8 nm). The knowledge of the optical constants (refractive index,n, and extinction coefficient,k) of thin films is of a great importance from the point of view of modelling and controlling the manufacture of various optical elements, such as waveguides, diffraction gratings, and microlenses. The presented results concern the optical properties of thin films from multicomponent chalcogenide glasses on the base of As2S3and GeS2determined by multiple-angle-of-incidence ellipsometry and regarded as a function of the composition and thickness. The homogeneity of the films is verified by applying single-angle calculations at different angles. Due to decomposition of the bulk glass during thermal evaporation, an optical inhomogeneity of the thin As (Ge)-S-Bi(Tl) films is observed. The profile ofnin depth of thin As-S-Tl (Bi) films was investigated by evaporation of discrete layers. It is demonstrated that homogenous layers from the previous compounds with controlled composition can be deposited by coevaporation of As2S3and metals or their compounds (Bi, Tl, In2S3).

Optical Investigations of In2Se2.7Sb0.3 Thin Films Prepared by Thermal Evaporation Technique

2019 ◽  
Vol 969 ◽  
pp. 355-360 ◽  
Author(s):  
Piyush Patel ◽  
Vimal Patel ◽  
Sandip Vyas ◽  
Jaydev Patel ◽  
Himanshu Pavagadhi
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Optical Band Gap ◽  
Thermal Evaporation ◽  
Radiation Detectors ◽  
Thermal Evaporation Technique ◽  
Clean Glass Substrate ◽  
Amorphous Nature ◽  
Evaporation Technique

The III-VI compound semiconductors are important for the fabrication of ionizing radiation detectors, solid-state electrodes, and photosensitive heterostructures, solar cell as well as ionic batteries. In this paper, In2Se2.7Sb0.3 thin films have been grown by thermal evaporation technique onto a with chemically clean glass substrate. Amorphous nature of the films has been discovered by UV-VIS spectrophotometer. The analysis by absorption spectra within the spectral range 200nm -900 nm has been used for the optical characterization of thin films. From these data the optical constants (absorption coefficient (α), refractive index (η), extinction coefficient (k)) and optical band gap (Eg) are studied. The results were discussed, and reported in detail.

Elaboration and Characterization of Mg-Doped ZnO Thin Films by Thermal Evaporation: Annealing Temperature Effect

2021 ◽  
Author(s):  
Fouaz Lekoui ◽  
Salim Hassani ◽  
Mohammed Ouchabane ◽  
Hocine Akkari ◽  
Driss Dergham ◽  
...  
Keyword(s):  
Thin Films ◽  
Temperature Effect ◽  
Annealing Temperature ◽  
Thermal Evaporation ◽  
Zno Thin Films ◽  
Doped Zno ◽  
Mg Doped

Ellipsometric characterization of thin films and superlattices

1990 ◽  
Vol 5 (2) ◽  
pp. 285-289 ◽  
Author(s):  
J. Bremer ◽  
O. Hunderi ◽  
Kong Fanping
Keyword(s):  
Thin Films ◽  
Ellipsometric Characterization

Observation of the Berreman Effect in Infrared Reflection-Absorption Spectra of Amorphous Titanium Oxide Thin Films Deposited on Aluminum

2000 ◽  
Vol 54 (5) ◽  
pp. 687-691 ◽  
Author(s):  
B. C. Trasferetti ◽  
C. U. Davanzo ◽  
N. C. da Cruz ◽  
M. A. B. de Moraes
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
Optical Constants ◽  
Polarized Light ◽  
Chemical Vapor ◽  
Layered System ◽  
Infrared Reflection ◽  
Fresnel Equation ◽  
Successful Technique

Infrared reflection-absorption spectra of plasma-enhanced chemical vapor deposition (PECVD) amorphous TiO2 thin films on aluminum were obtained with s- and p-polarized light and oblique incidence angles. Such spectra were analyzed by means of spectral simulations based on a Fresnel equation for a three-layered system. The optical constants used in the simulations were obtained through the Kramers–Krönig analysis of the reflectance spectra of a pellet of powdered amorphous TiO2. LO-TO energy-loss functions were also calculated from these optical constants, and a splitting was observed. A good qualitative agreement between experimental and simulated spectra was achieved, and the Berreman effect was observed in both cases when p-polarized light was used. It was shown, therefore, that the Berreman effect makes infrared reflection-absorption spectroscopy a successful technique for the characterization of an amorphous TiO2 thin layer on aluminum.

Ge-Chalcogenide Glasses – Properties and Application as Optical Material

2013 ◽  
Vol 538 ◽  
pp. 316-319 ◽  
Author(s):  
Tamara Petkova ◽  
Vania Ilcheva ◽  
P. Ilchev ◽  
P. Petkov
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Chalcogenide Glasses ◽  
Optical Storage ◽  
Thermal And Mechanical Properties ◽  
Optical Elements ◽  
Storage Media ◽  
Simple Technology ◽  
Chalcogenide Materials ◽  
The Impact

The great interest toward chalcogenide materials is due to the simple technology of preparation in bulk forms and thin films; good thermal and mechanical properties; transparency and photo-sensibility in the IR spectral range. These advantages determine the possibilities for potential application of these materials like optical storage media, memory devices, optical elements (lenses, waveguides, gratings, etc). The idea of present study is to trace the impact of gallium or indium as metal introduction on the behaviors of the glasses from germanium - chalcogenide system.

X-ray diffraction and X-ray photoelectron spectroscopy characterization of sulfurized tin thin films deposited by thermal evaporation

2018 ◽  
Vol 645 ◽  
pp. 409-416
Author(s):  
Hiroto Oomae ◽  
Takahito Eguchi ◽  
Kunihiko Tanaka ◽  
Misao Yamane ◽  
Naofumi Ohtsu
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Thermal Evaporation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Tin Thin Films
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