New Focusing Reflectometer for Measuring Optical Constants of Thin Films

1971 ◽  
Vol 10 (2) ◽  
pp. 342 ◽  
Author(s):  
R. E. Burge ◽  
A. T. Davidson ◽  
J. C. Draper ◽  
G. R. Field ◽  
E. Murphy
Keyword(s):  
Thin Films ◽  
Optical Constants

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films

Optical constants of Sn-doped amorphous Ge-As-Te thin films and their physical characterization

2020 ◽  
Vol 583 ◽  
pp. 412066 ◽  
Author(s):  
Imed Boukhris ◽  
Imen Kebaili ◽  
Sami Znaidia ◽  
R. Neffati ◽  
H.H. Hegazy ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Physical Characterization

Effect of Sn substitution for Se on dispersive optical constants of amorphous Se–Te–Sn thin films

2017 ◽  
pp. 1-9 ◽  
Author(s):  
M. A. Dabban ◽  
Nema M. Abdelazim ◽  
Alaa M. Abd-Elnaiem ◽  
S. Mustafa ◽  
M. A. Abdel-Rahim
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Sn Substitution

Optical constants measurement of single-layer thin films on transparent substrates

1998 ◽  
Vol 158 (1-6) ◽  
pp. 221-230 ◽  
Author(s):  
A. Penzkofer ◽  
E. Drotleff ◽  
W. Holzer
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Single Layer

Calculation of the optical constants of thin films with consideration of the surface roughness and the width of the spectrum of the probing radiation

1980 ◽  
Vol 32 (4) ◽  
pp. 388-390
Author(s):  
B. V. Panasenko ◽  
A. G. Gusev ◽  
I. S. Gainutdinov ◽  
E. A. Nesmelov ◽  
R. B. Tagirov
Keyword(s):  
Thin Films ◽  
Surface Roughness ◽  
Optical Constants

Determination of the Optical Constants of Thin Films Using Photoacoustic Spectroscopy

1981 ◽  
Vol 20 (9) ◽  
pp. L665-L668 ◽  
Author(s):  
Satoshi Yamasaki ◽  
Hideyo Okushi ◽  
Akihisa Matsuda ◽  
Hidetoshi Oheda ◽  
Nobuhiro Hata ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoacoustic Spectroscopy ◽  
Optical Constants

Wide variations of SiCxNy:H thin films optical constants deposited by H2/N2/Ar/hexamethyldisilazane microwave plasma

2012 ◽  
Vol 208 ◽  
pp. 46-50 ◽  
Author(s):  
Simon Bulou ◽  
Laurent Le Brizoual ◽  
Patrice Miska ◽  
Ludovic de Poucques ◽  
Jamal Bougdira ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Microwave Plasma
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