In-Situ Supply-Noise Measurement in LSIs with Millivolt Accuracy and Nanosecond-Order Time Resolution
2007 ◽
Vol 42
(4)
◽
pp. 784-789
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Keyword(s):
2009 ◽
Vol 32
(2)
◽
pp. 248-259
◽
Keyword(s):
Keyword(s):
1996 ◽
Vol 100
(26)
◽
pp. 10831-10833
◽
Keyword(s):